Signal distribution apparatus
AssigneeQualiTau, Inc.
InventorJames Borthwick
Life of this patent
Estimating the term…
Abstract
A signal distribution apparatus for distributing a stress signal to a plurality of devices under test (DUTs) is disclosed. The distribution apparatus includes a single input that receives the stress voltage signal to be distributed, a plurality of outputs that distribute the stress voltage signal to the plurality of DUTs, and a plurality of integrated current limiter and switch circuits. Each integrated current limiter and switch circuit connects a DUT of the plurality of DUTs to the single input through one of the plurality of outputs, and includes at least one combined switching and current limiting element.
Claims13
A signal distribution apparatus for applying a stress voltage signal to a plurality of devices under test (DUTs), the distribution apparatus comprising:
- a single input that receives the stress voltage signal to be distributed;
- a plurality of outputs that distribute the stress voltage signal to the plurality of DUTs;
- and
- a plurality of integrated current limiter and switch circuits, each integrated current limiter and switch circuit connecting a DUT of the plurality of DUTs to the single input through one of the plurality of outputs, and comprising a pair of transistors for limiting and switching bipolar currents to and from the DUT, wherein the pair of transistors is connected in series with a series current limiting resistor between the pair or transistors.
A signal distribution apparatus for applying a stress voltage signal to a plurality of devices under test (DUTs), the distribution apparatus comprising:
- a single input that receives the stress voltage signal to be distributed;
- a plurality of outputs that distribute the stress voltage signal to the plurality of DUTs;
- and
- a plurality of integrated current limiter and switch circuits, each integrated current limiter and switch circuit connecting a DUT of the plurality of DUTs to the single input through one of the plurality of outputs, and comprising at least one combined switching and current limiting element and a biasing circuit connected to the pair of transistors, the biasing circuit comprising a photovoltaic isolator for biasing the pair of transistors to an on or off state, wherein the at least one combined switching and current limiting element is a pair of transistors for limiting and switching bipolar currents to and from the DUT.
A method for distributing a stress voltage signal to a plurality of devices under test (DUTs), the method comprising:
- receiving the stress voltage signal to be distributed at a single input;
- distributing the stress voltage signal to the plurality of DUTs through a plurality of outputs;
- connecting a DUT of the plurality of DUTs to the single input, through an output of the plurality of outputs, and through an integrated current limiter and switch circuit of a plurality of integrated current limiter and switch circuits, each integrated current limiter and switch circuit comprising a pair of transistors for limiting and switching bipolar currents to and from the DUT;
- and
- connecting the pair of transistors with a series current limiting resistor in series between the pair of transistors.
A method for distributing a stress voltage signal to a plurality of devices under test (DUTs), the method comprising:
- receiving the stress voltage signal to be distributed at a single input;
- distributing the stress voltage signal to the plurality of DUTs through a plurality of outputs;
- and
- connecting a DUT of the plurality of DUTs to the single input, through an output of the plurality of outputs, and through an integrated current limiter and switch circuit of a plurality of integrated current limiter and switch circuits, each integrated current limiter and switch circuit comprising at least one combined switching and current limiting element, wherein the at least one combined switching and current limiting element is a pair of transistors for limiting and switching bipolar currents to and from the DUT;
- and
- connecting a biasing circuit to the pair of transistors, the biasing circuit comprising a photovoltaic isolator for biasing the pair of transistors to an on or off state.
Dependencies are inferred from the claim text.