H10F 39/154
Charge-injection device [cid] image sensors
Official title: {Charge-injection device [CID] image sensors (H10F39/156, H10F39/157 take precedence)}
H10F39/154 (Charge-injection device [cid] image sensors) appears on 41 US grants and 8 published applications in this corpus.
Search patents in H10F- Granted patents
- 41
- Published applications
- 8
- Assignees
- 15
- Inventors
- 78
- Latest grant
- 4 Aug 2020
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 4 | 0 |
| 1977 | 7 | 0 |
| 1978 | 1 | 0 |
| 1979 | 1 | 0 |
| 1980 | 3 | 0 |
| 1981 | 3 | 0 |
| 1982 | 2 | 0 |
| 1983 | 3 | 0 |
| 1984 | 2 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 4 | 0 |
| 1988 | 2 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 1 | 1 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 1 |
| 2010 | 0 | 0 |
| 2011 | 1 | 1 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 1 |
| 2015 | 2 | 1 |
| 2016 | 1 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 2 |
| 2019 | 1 | 1 |
| 2020 | 2 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Image capturing module and manufacturing method thereof4 Aug 2020US 10,734,435 B2Gingy Technology Inc.
- Inspection substrate and an inspection method28 Jul 2020US 10,725,390 B2ASML Netherlands B. V.
- Inspection substrate and an inspection method26 Feb 2019US 10,216,100 B2ASML Netherlands B. V.
- Solid-state imaging device, method of manufacturing solid-state imaging device and electronic apparatus20 Sep 2016US 9,450,003 B2Sony Semiconductor Solutions Corporation
- Low light adaptive imaging device8 Dec 2015US 9,210,304 B2Empire Technology Development LLC
- Inspection Substrate and an Inspection Method16 May 2019US 2019/0146352 A1ASML Netherlands B. V.
- Image capturing module and manufacturing method thereof18 Oct 2018US 2018/0301500 A1Gingy Technology Inc.
- Inspection Substrate and an Inspection Method28 Jun 2018US 2018/0181004 A1ASML Netherlands B. V.
- Solid-state imaging device, method of manufacturing solid-state imaging device, and electronic apparatus21 May 2015US 2015/0137188 A1Sony Corporation
- Low light adaptive imaging device27 Feb 2014US 2014/0055648 A1Empire Technology Development LLC
Most cited
By later US patents
- Hydrogen iodide etch of tin oxide50US 4,708,766 ATexas Instruments Incorporated · 1987
- Series-parallel scan, IR, CID, focal-plane array32US 4,054,797 AThe United States of America as represented by the Secretary of the Navy · 1977
- Solid state imaging apparatus22US 4,011,441 AGeneral Electric Company · 1977
- Solid state image sensor with image sensing elements having charge coupled photocapacitors and a floating gate amplifier21US 4,388,532 AEastman Kodak Company · 1983
- Direct coupled charge injection readout circuit and readout method for an IR sensing charge injection device21US 4,652,766 AGeneral Electric Company · 1987