H01J 2237/2617
Comparison or superposition of transmission images
Official title: Comparison or superposition of transmission images; Moiré
H01J2237/2617 (Comparison or superposition of transmission images) appears on 25 US grants and 26 published applications in this corpus.
Search patents in H01J- Granted patents
- 25
- Published applications
- 26
- Assignees
- 16
- Inventors
- 72
- Latest grant
- 26 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 1 | 2 |
| 2005 | 0 | 0 |
| 2006 | 1 | 2 |
| 2007 | 1 | 0 |
| 2008 | 1 | 2 |
| 2009 | 1 | 2 |
| 2010 | 2 | 0 |
| 2011 | 0 | 1 |
| 2012 | 0 | 0 |
| 2013 | 1 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 1 |
| 2016 | 3 | 3 |
| 2017 | 1 | 0 |
| 2018 | 0 | 1 |
| 2019 | 0 | 2 |
| 2020 | 4 | 4 |
| 2021 | 2 | 3 |
| 2022 | 2 | 0 |
| 2023 | 2 | 1 |
| 2024 | 0 | 0 |
| 2025 | 0 | 1 |
| 2026 | 2 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Blanker-enhanced moire imaging26 May 2026US 12,640,332 B2FEI Company
- Pattern inspection apparatus, and method for acquiring alignment amount between outlines13 Jan 2026US 12,525,425 B2NuFlare Technology, Inc.
- Stimulated or non-equilibrium energy-loss and energy-gain spectroscopy device28 Nov 2023US 11,830,718 B2Centre National De La Recherche Scientifique
- Method of imaging a specimen using a transmission charged particle microscope7 Nov 2023US 11,810,751 B2FEI Company
- Aberration reduction in multipass electron microscopy27 Sep 2022US 11,456,148 B2The Board of Trustees of the Leland Stanford Junior University
- Rapid mode switching of charged-particle-beam devices13 Aug 2026US 2026/0237595 A1
- Blanker-enhanced moire imaging27 Mar 2025US 2025/0104958 A1FEI Company
- Pattern inspection apparatus, and method for acquiring alignment amount between outlines11 May 2023US 2023/0145411 A1NuFlare Technology, Inc.
- Method of imaging a specimen using a transmission charged particle microscope30 Dec 2021US 2021/0407762 A1FEI Company
- Methods and systems for acquiring 3d diffraction data30 Sep 2021US 2021/0305010 A1FEI Company
Most cited
By later US patents
- Defect observing electron microscope11US 5,744,800 AHitachi, Ltd. · 1998
- Electron beam apparatus and method for production of its specimen chamber3US 7,030,376 B2Hitachi High-Technologies Corporation · 2006
- Diffraction pattern detection in a transmission charged particle microscope2US 10,651,008 B2FEI Company · 2020
- System and method of analyzing a crystal defect2US 10,727,025 B2Samsung Electronics Co., Ltd. · 2020
- Three-dimensional structure verification supporting apparatus, three-dimensional structure verification method, recording medium, and program therefor2US 6,828,555 B2Center for Advanced Science and Technology Incubation, Ltd. · 2004