H01J 2237/24455
Transmitted particle detectors
H01J2237/24455 (Transmitted particle detectors) appears on 100 US grants and 109 published applications in this corpus.
Search patents in H01J- Granted patents
- 100
- Published applications
- 109
- Assignees
- 59
- Inventors
- 234
- Latest grant
- 23 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 2 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 1 | 2 |
| 2005 | 1 | 1 |
| 2006 | 0 | 3 |
| 2007 | 4 | 3 |
| 2008 | 2 | 3 |
| 2009 | 1 | 6 |
| 2010 | 6 | 6 |
| 2011 | 4 | 1 |
| 2012 | 6 | 9 |
| 2013 | 5 | 0 |
| 2014 | 1 | 3 |
| 2015 | 4 | 4 |
| 2016 | 5 | 9 |
| 2017 | 5 | 10 |
| 2018 | 6 | 1 |
| 2019 | 6 | 6 |
| 2020 | 10 | 11 |
| 2021 | 8 | 4 |
| 2022 | 2 | 7 |
| 2023 | 7 | 5 |
| 2024 | 4 | 6 |
| 2025 | 4 | 3 |
| 2026 | 3 | 6 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Microchips for use in electron microscopes and related methods23 Jun 2026US 12,665,163 B2Northwestern University
- Charged particle beam system and control method therefor24 Mar 2026US 12,586,750 B2JEOL Ltd.
- Electron microscope and specimen orientation alignment method24 Mar 2026US 12,586,752 B2JEOL Ltd.
- Electron microscope analysis system4 Nov 2025US 12,463,007 B2Riken
- Charged particle beam apparatus28 Oct 2025US 12,456,598 B2Hitachi High-Tech Corporation
- Microchips for use in electron microscopes and related methods1 Oct 2026US 2026/0302128 A1Northwestern University
- Rapid mode switching of charged-particle-beam devices13 Aug 2026US 2026/0237595 A1
- System and method for operating semiconductor fabrication apparatus13 Aug 2026US 2026/0237615 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Charged particle beam device and control method therefor11 Jun 2026US 2026/0162929 A1Hitachi, Ltd.
- Magnetic magnification control for electron microscopes12 Mar 2026US 2026/0074139 A1FEI Company
Most cited
By later US patents
- Pattern inspection apparatus and electron beam apparatus86US 5,557,105 AFujitsu Limited · 1996
- System for monitoring the position intensity uniformity and directivity of a beam of ionizing radiation37US 4,206,355 AC. G. R. MeV · 1980
- Detector system for use with transmission electron microscope spectroscopy18US 8,334,512 B2FEI Company · 2012
- High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing13US 9,165,743 B2Lawrence Livermore National Security, LLC · 2015
- Transmission electron microscope and method of observing element distribution by using the same12US 5,578,823 AHitachi, Ltd. · 1996