H01J 2237/0535
Mirror analyser
H01J2237/0535 (Mirror analyser) appears on 18 US grants and 14 published applications in this corpus.
Search patents in H01J- Granted patents
- 18
- Published applications
- 14
- Assignees
- 13
- Inventors
- 24
- Latest grant
- 22 May 2018
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2004 | 1 | 2 |
| 2005 | 2 | 1 |
| 2006 | 1 | 1 |
| 2007 | 1 | 1 |
| 2008 | 1 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 1 |
| 2011 | 0 | 1 |
| 2012 | 2 | 2 |
| 2013 | 4 | 2 |
| 2014 | 2 | 1 |
| 2015 | 2 | 0 |
| 2016 | 1 | 1 |
| 2017 | 0 | 0 |
| 2018 | 1 | 1 |
By publication year.
Recent patents
- Analyser arrangement for particle spectrometer22 May 2018US 9,978,579 B2Scienta Omicron AB
- Analyser arrangement for particle spectrometer6 Sep 2016US 9,437,408 B2Scienta Omicron AB
- Method for improving performance of an energy filter2 Jun 2015US 9,048,062 B1Hermes Microvision, Inc.
- Electron beam apparatus2 Jun 2015US 9,048,063 B1Hermes Microvision, Inc.
- Charged particle detector9 Dec 2014US 8,907,305 B2FEI Company
- Analyser arrangement for particle spectrometer20 Sep 2018US 2018/0269054 A1Scienta Omicron AB
- Analyser arrangement for particle spectrometer17 Nov 2016US 2016/0336166 A1Scienta Omicron AB
- Analyser arrangement for particle spectrometer11 Dec 2014US 2014/0361161 A1Vg Scienta AB
- Charged particle detector22 Aug 2013US 2013/0214156 A1FEI Company
- Sequential radial mirror analyser23 May 2013US 2013/0126730 A1National University of Singapore
Most cited
By later US patents
- Scanning electron microscope66US 6,847,038 B2Hitachi, Ltd. · 2005
- Charged particle device22US 6,730,907 B1ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH · 2004
- Atom probe14US 8,513,597 B2Cameca Instruments, Inc. · 2013
- Mirror monochromator for charged particle beam apparatus11US 8,183,526 B1Electron Optica, Inc. · 2012
- Mirror energy filter for electron beam apparatus10US 8,334,508 B1Electron Optica, Inc. · 2012