G11C 13/0035
Evaluating degradation, retention or wearout
Official title: {Evaluating degradation, retention or wearout, e.g. by counting writing cycles}
G11C13/0035 (Evaluating degradation, retention or wearout) appears on 348 US grants and 370 published applications in this corpus.
Search patents in G11C- Granted patents
- 348
- Published applications
- 370
- Assignees
- 93
- Inventors
- 594
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2004 | 1 | 1 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 1 | 0 |
| 2008 | 0 | 1 |
| 2009 | 0 | 4 |
| 2010 | 2 | 9 |
| 2011 | 5 | 9 |
| 2012 | 5 | 13 |
| 2013 | 12 | 17 |
| 2014 | 25 | 35 |
| 2015 | 31 | 33 |
| 2016 | 33 | 24 |
| 2017 | 25 | 13 |
| 2018 | 19 | 25 |
| 2019 | 22 | 25 |
| 2020 | 35 | 32 |
| 2021 | 28 | 24 |
| 2022 | 31 | 44 |
| 2023 | 22 | 16 |
| 2024 | 26 | 18 |
| 2025 | 18 | 15 |
| 2026 | 7 | 12 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Phase-change random access memory device and methods of making the same25 Aug 2026US 12,721,051 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Heat dissipation in resistive memories11 Aug 2026US 12,707,903 B2Virginia Tech Intellectual Properties, Inc.
- Utilizing flash memory of storage devices experiencing power loss protection failures14 Jul 2026US 12,682,949 B2Everpure, Inc.
- NAND detect empty page scan using subsets of wordlines on a page30 Jun 2026US 12,670,961 B2Micron Technology, Inc.
- Controlling erase-to-program delay for improving data retention5 May 2026US 12,620,445 B2Micron Technology, Inc.
- Managing solid state storage devices1 Oct 2026US 2026/0301808 A1Everpure, Inc.
- Nand detect empty page scan1 Oct 2026US 2026/0301822 A1Micron Technology, Inc.
- Electronic device and method27 Aug 2026US 2026/0252254 A1STMicroelectronics International N. V.
- System and method for extending lifetime of memory device23 Jul 2026US 2026/0212947 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Signal development caching in a memory device2 Jul 2026US 2026/0186709 A1Micron Technology, Inc.
Most cited
By later US patents
- Preservation circuit and methods to maintain values representing data in one or more layers of memory234US 7,719,876 B2Unity Semiconductor Corporation · 2010
- State determination in resistance variable memory81US 9,019,754 B1Micron Technology, Inc. · 2015
- Preservation circuit and methods to maintain values representing data in one or more layers of memory47US 7,898,841 B2Unity Semiconductor Corporation · 2011
- Semiconductor memory device and method for correcting a reference cell46US 6,831,872 B2Sharp Kabushiki Kaisha · 2004
- Reconfigurable memory arrays having programmable impedance elements and corresponding methods42US 8,331,128 B1Adesto Technologies Corporation · 2012