G05B 2219/32225
Randomize workpiece treatment order within lot to improve lot-to-lot comparisons
G05B2219/32225 (Randomize workpiece treatment order within lot to improve lot-to-lot comparisons) appears on 8 US grants and 7 published applications in this corpus.
Search patents in G05B- Granted patents
- 8
- Published applications
- 7
- Assignees
- 7
- Inventors
- 18
- Latest grant
- 5 Apr 2022
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2002 | 0 | 1 |
| 2003 | 0 | 0 |
| 2004 | 1 | 2 |
| 2005 | 2 | 0 |
| 2006 | 0 | 0 |
| 2007 | 1 | 0 |
| 2008 | 0 | 3 |
| 2009 | 0 | 0 |
| 2010 | 2 | 0 |
| 2011 | 1 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 0 | 0 |
| 2021 | 0 | 1 |
| 2022 | 1 | 0 |
By publication year.
Recent patents
- Inspection method for inspecting display panel and inspection apparatus5 Apr 2022US 11,294,361 B2Chongqing Hkc Optoelectronics Technology Co., Ltd.
- Methods, systems, and computer program products for product randomization and analysis in a manufacturing environment6 Sep 2011US 8,015,040 B2International Business Machines Corporation
- Method and system for randomizing wafers in a complex process line9 Nov 2010US 7,831,324 B2Globalfoundries Inc.
- Method and system for managing wafer processing21 Sep 2010US 7,801,636 B2Samsung Electronics Co., Ltd.
- Method and apparatus for scheduling metrology based on a jeopardy count20 Nov 2007US 7,299,106 B1Advanced Micro Devices, Inc.
- Inspection method for inspecting display panel and inspection apparatus28 Oct 2021US 2021/0333784 A1Chongqing Hkc Optoelectronics Technology Co., Ltd.
- Methods, systems, and computer program products for product randomization and analysis in a manufacturing environment31 Jul 2008US 2008/0183321 A1International Business Machines Corporation
- Method and system for randomizing wafers in a complex process line1 May 2008US 2008/0103618 A1Globalfoundries Inc.
- Method and system for managing wafer processing27 Mar 2008US 2008/0077269 A1Samsung Electronics Co., Ltd.
- In-situ randomization and recording of wafer processing order at process tools10 Jun 2004US 2004/0111176 A1Texas Instruments Incorporated
Most cited
By later US patents
- In-situ randomization and recording of wafer processing order at process tools8US 6,684,125 B2Texas Instruments Incorporated · 2004
- In-situ randomization and recording of wafer processing order at process tools5US 6,862,495 B2Texas Instruments Incorporated · 2005
- In-situ randomization and recording of wafer processing order at process tools5US 6,975,920 B2Texas Instruments Incorporated · 2005
- Method and apparatus for scheduling metrology based on a jeopardy count1US 7,299,106 B1Advanced Micro Devices, Inc. · 2007
- Method and system for managing wafer processing1US 7,801,636 B2Samsung Electronics Co., Ltd. · 2010