Inspection method for inspecting display panel and inspection apparatus
AssigneesHkc Corporation Limited, Chongqing Hkc Optoelectronics Technology Co., Ltd.
InventorPo-Sung Pan
Life of this patent
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Abstract
The present application provides a method for inspecting a display panel and an inspection apparatus. Wherein the method for inspecting the display panel including the following steps: setting substrate random sampling parameters in a manufacturing process by a manufacturing execution module, and transmitting the random sampling parameters to a production line control module; receiving and storing the random sampling parameters by the production line control module; generating a random sampling control signal and transmitting to a detector according to the random sampling parameters by the production line control module; and performing a random sampling to a substrate by the detector in accordance with the random sampling control signal.
Claims7
A method for inspecting a display panel, comprising:
- setting substrate random sampling parameters respectively for steps of a production chain in a manufacturing process of the display panel by a manufacturing execution module, and transmitting the random sampling parameters to a production line control module;
- receiving and storing the random sampling parameters by the production line control module;
- generating a random sampling control signal and transmitting to a detector by the production line control module, wherein the random sampling control signal is one of corresponding random sampling control signals generated in the respective steps according to the random sampling parameters;
- and
- performing a random sampling to a substrate by the detector in accordance with the random sampling control signal.
Dependencies are inferred from the claim text.