G05B 2219/32205
Use model error adapted to type of workpiece
G05B2219/32205 (Use model error adapted to type of workpiece) appears on 7 US grants and 11 published applications in this corpus.
Search patents in G05B- Granted patents
- 7
- Published applications
- 11
- Assignees
- 9
- Inventors
- 21
- Latest grant
- 25 Nov 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2005 | 0 | 1 |
| 2006 | 1 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 1 |
| 2011 | 0 | 0 |
| 2012 | 0 | 1 |
| 2013 | 0 | 1 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 1 | 1 |
| 2018 | 0 | 2 |
| 2019 | 1 | 1 |
| 2020 | 2 | 0 |
| 2021 | 0 | 1 |
| 2022 | 0 | 0 |
| 2023 | 0 | 1 |
| 2024 | 0 | 0 |
| 2025 | 2 | 0 |
| 2026 | 0 | 1 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Data processing device, data processing method, and production system25 Nov 2025US 12,482,009 B2Yokogawa Electric Corporation
- Method and machine for examining wafers19 Aug 2025US 12,394,674 B2ASML Netherlands B. V.
- Method and machine for examining wafers17 Nov 2020US 10,840,156 B2ASML Netherlands B. V.
- Auto defect screening using adaptive machine learning in semiconductor device manufacturing flow25 Aug 2020US 10,754,309 B2APPLIED Materials.Inc.
- Auto defect screening using adaptive machine learning in semiconductor device manufacturing flow30 Jul 2019US 10,365,617 B2DMO Systems Limited
- Method and machine for examining wafers19 Feb 2026US 2026/0052954 A1ASML Netherlands B. V.
- Data processing device, data processing method, and production system27 Apr 2023US 2023/0129033 A1Yokogawa Electric Corporation
- Method and machine for examining wafers24 Jun 2021US 2021/0193537 A1ASML Netherlands B. V.
- Auto defect screening using adaptive machine learning in semiconductor device manufacturing flow19 Dec 2019US 2019/0384236 A1APPLIED Materials.Inc.
- Auto defect screening using adaptive machine learning in semiconductor device manufacturing flow14 Jun 2018US 2018/0164792 A1DMO Systems Limited
Most cited
By later US patents
- Auto defect screening using adaptive machine learning in semiconductor device manufacturing flow4US 10,365,617 B2DMO Systems Limited · 2019
- Method and apparatus for determining product-specific error and tool drift4US 7,043,325 B1Advanced Micro Devices, Inc. · 2006
- Method and machine for examining wafers1US 12,394,674 B2ASML Netherlands B. V. · 2025