G02B 21/0016
Technical microscopes
Official title: {Technical microscopes, e.g. for inspection or measuring in industrial production processes}
G02B21/0016 (Technical microscopes) appears on 426 US grants and 455 published applications in this corpus.
Search patents in G02B- Granted patents
- 426
- Published applications
- 455
- Assignees
- 268
- Inventors
- 1,106
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 5 | 0 |
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 1 | 0 |
| 1982 | 2 | 0 |
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 1 | 0 |
| 1988 | 1 | 0 |
| 1989 | 3 | 0 |
| 1990 | 2 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 2 | 0 |
| 1994 | 2 | 0 |
| 1995 | 4 | 0 |
| 1996 | 2 | 0 |
| 1997 | 3 | 0 |
| 1998 | 3 | 0 |
| 1999 | 1 | 0 |
| 2000 | 2 | 0 |
| 2001 | 3 | 3 |
| 2002 | 3 | 8 |
| 2003 | 7 | 8 |
| 2004 | 8 | 14 |
| 2005 | 8 | 9 |
| 2006 | 17 | 24 |
| 2007 | 11 | 10 |
| 2008 | 13 | 12 |
| 2009 | 10 | 4 |
| 2010 | 4 | 8 |
| 2011 | 2 | 10 |
| 2012 | 6 | 18 |
| 2013 | 5 | 13 |
| 2014 | 16 | 27 |
| 2015 | 19 | 25 |
| 2016 | 13 | 25 |
| 2017 | 28 | 29 |
| 2018 | 36 | 37 |
| 2019 | 33 | 22 |
| 2020 | 25 | 23 |
| 2021 | 24 | 29 |
| 2022 | 31 | 30 |
| 2023 | 20 | 19 |
| 2024 | 19 | 15 |
| 2025 | 19 | 20 |
| 2026 | 8 | 13 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Semiconductor inspection tool and methods of operation22 Sep 2026US 12,742,954 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Optical filtering device, method of controlling optical filtering device, and MEMS shutter8 Sep 2026US 12,730,288 B2Hitachi High-Tech Corporation
- Inspection of optical components in optical systems16 Jun 2026US 12,656,217 B2Viavi Solutions Inc.
- Metrology system utilizing scan lens for points-from-focus type processes16 Jun 2026US 12,656,593 B2Mitutoyo Corporation
- System and method for grading clarity of gemstones14 Apr 2026US 12,601,690 B2Sarine Technologies Ltd.
- Apparatus for an optical imaging system, optical imaging system, method and computer program8 Oct 2026US 2026/0309971 A1Leica Instruments (Singapore) Pte. Ltd.
- Method of improved bright field-dark field metrology1 Oct 2026US 2026/0299276 A1Nanoverse Technologies Ltd
- Methods and systems for highly parallelized entanglement over a large atom array6 Aug 2026US 2026/0231695 A1Atom Computing Inc.
- Microscope that includes a pattern projection component25 Jun 2026US 2026/0177797 A1Viavi Solutions Inc.
- Ferrule profile imaging and measurement4 Jun 2026US 2026/0153690 A1Viavi Solutions Inc.
Most cited
By later US patents
- Apparatus and a method for high numerical aperture microscopic examination of materials158US 5,220,403 AInternational Business Machines Corporation · 1993
- Transportable image emission microscope143US 5,475,316 AHypervision, Inc. · 1995
- Automated wafer inspection system140US 4,818,169 A1989
- System for creating microscopic digital montage images103US 7,155,049 B2Trestle Acquisition Corp. · 2006
- Apparatus and a method for high numerical aperture microscopic examination of materials102US 5,208,648 AInternational Business Machines Corporation · 1993