G01Q 60/48
Probes, their manufacture, or their related instrumentation
Official title: Probes, their manufacture, or their related instrumentation, e.g. holders
G01Q60/48 (Probes, their manufacture, or their related instrumentation) appears on 22 US grants and 21 published applications in this corpus.
Search patents in G01Q- Granted patents
- 22
- Published applications
- 21
- Assignees
- 19
- Inventors
- 46
- Latest grant
- 7 Nov 2023
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 1 | 2 |
| 2003 | 1 | 2 |
| 2004 | 3 | 2 |
| 2005 | 2 | 2 |
| 2006 | 0 | 2 |
| 2007 | 2 | 2 |
| 2008 | 1 | 0 |
| 2009 | 0 | 1 |
| 2010 | 3 | 2 |
| 2011 | 0 | 0 |
| 2012 | 1 | 0 |
| 2013 | 0 | 0 |
| 2014 | 1 | 1 |
| 2015 | 1 | 2 |
| 2016 | 2 | 1 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 0 | 1 |
| 2021 | 1 | 0 |
| 2022 | 0 | 1 |
| 2023 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Atomic force microscopy apparatus, methods, and applications7 Nov 2023US 11,808,783 B2Cornell University
- Atomic force microscopy apparatus, methods, and applications16 Nov 2021US 11,175,306 B2Cornell University
- System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing29 Nov 2016US 9,506,947 B2DCG Systems, Inc.
- Probe unit for test tools and method of manufacturing the same11 Oct 2016US 9,465,048 B1Inotera Memories, Inc.
- Method and means for coupling high-frequency energy to and/or from the nanoscale junction of an electrically-conductive tip with a semiconductor7 Jul 2015US 9,075,081 B2
- Atomic force microscopy apparatus, methods, and applications10 Feb 2022US 2022/0043024 A1Cornell University
- Atomic force microscopy apparatus, methods, and applications25 Jun 2020US 2020/0204112 A1Cornell University
- Probe unit for test tools and method of manufacturing the same29 Sep 2016US 2016/0282385 A1Inotera Memories, Inc.
- System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing22 Oct 2015US 2015/0301078 A1DCG Systems, Inc.
- Method and Means for Coupling High-Frequency Energy to and/or from the Nanoscale Junction of an Electrically-Conductive Tip with a Semiconductor5 Mar 2015US 2015/0067931 A1
Most cited
By later US patents
- Scanning capacitance microscope39US 4,481,616 ARCA Corporation · 1984
- Scanning microwave microscope capable of realizing high resolution and microwave resonator37US 6,614,227 B2NEC Corporation · 2003
- Scanning probe microscope and method for obtaining topographic image, surface potential image, and electrostatic capacitance distribution image18US 5,742,172 ASeiko Instruments Inc. · 1998
- Electrical scanning probe microscope apparatus15US 6,975,129 B2National Applied Research Labratories · 2005
- Method and apparatus for measuring electrical properties in torsional resonance mode11US 7,155,964 B2Veeco Instruments Inc. · 2007