G01N 23/2209
Using wavelength dispersive spectroscopy [wds]
Official title: using wavelength dispersive spectroscopy [WDS]
G01N23/2209 (Using wavelength dispersive spectroscopy [wds]) appears on 62 US grants and 69 published applications in this corpus.
Search patents in G01N- Granted patents
- 62
- Published applications
- 69
- Assignees
- 38
- Inventors
- 131
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1983 | 1 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 1 | 0 |
| 2005 | 0 | 0 |
| 2006 | 1 | 0 |
| 2007 | 0 | 1 |
| 2008 | 1 | 1 |
| 2009 | 1 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 1 | 3 |
| 2017 | 1 | 3 |
| 2018 | 4 | 3 |
| 2019 | 1 | 7 |
| 2020 | 5 | 10 |
| 2021 | 8 | 9 |
| 2022 | 11 | 10 |
| 2023 | 7 | 5 |
| 2024 | 4 | 6 |
| 2025 | 6 | 7 |
| 2026 | 4 | 4 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- System and method for approximating X-ray intensities for a sample measured by an X-ray detection system6 Oct 2026US 12,754,151 B2Bruker AXS GmbH
- X-ray fluorescence analyzer28 Jul 2026US 12,693,247 B2Shimadzu Corporation
- Holder, analysis apparatus including the same, and battery analysis method21 Jul 2026US 12,687,507 B2Shimadzu Corporation
- Analyzing method and analyzer19 May 2026US 12,631,578 B2JEOL Ltd.
- System and method for determining mass fractions in a test sample with wave-length dispersive x-ray fluorescence spectrometers9 Sep 2025US 12,411,098 B2Bruker AXS GmbH
- Method and Apparatus for Analysis27 Aug 2026US 2026/0251597 A1JEOL Ltd.
- System and method for x-ray fluorescence spectrometry of unknown samples30 Apr 2026US 2026/0118293 A1Bruker AXS GmbH
- X-ray fluorescence spectrometer23 Apr 2026US 2026/0110649 A1Rigaku Corporation
- X-ray fluorescence spectrometer23 Apr 2026US 2026/0110650 A1Rigaku Corporation
- Angle resolved wavelength dispersive spectrometer4 Dec 2025US 2025/0369904 A1Sigray, Inc.
Most cited
By later US patents
- Film thickness measurement using electron-beam induced x-ray microanalysis66US 6,787,773 B1KLA-Tencor Corporation · 2004
- Method and apparatus for surface characterization and process control utilizing radiation from desorbed particles36US 4,393,311 ABell Telephone Laboratories, Incorporated · 1983
- Surface analysis method and apparatus24US 5,055,679 AHitachi, Ltd. · 1991
- X-ray emission spectrometer system22US 10,578,566 B2Sigray, Inc. · 2020
- Method of measurement of abnormal wear debris and particulate contamination in machine components by oil analysis19US 5,586,161 AEnergy Resources of Australia Ltd. · 1996