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US 2026/0110649 A1Published application
X-ray fluorescence spectrometer
AssigneeRigaku Corporation
InventorsShinya HARA, Yasujiro YAMADA, Natsumi OKAZAKI
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AssigneeRigaku Corporation
InventorsShinya HARA, Yasujiro YAMADA, Natsumi OKAZAKI
Estimating the term…
In an X-ray fluorescence spectrometer of the present invention, a quantification unit causes a displaying unit to display, as a quantitative-value theoretical standard deviation regarding an analytical component, a difference between a first quantitative value of the analytical component based on measured intensities regarding respective components and a second quantitative value of the analytical component obtained by causing, in calibration curve equations for the respective components, the measured intensities regarding the respective components to fluctuate in a direction in which change in the content of the analytical component increases.
An X-ray fluorescence spectrometer comprising a quantification unit in which a calibration curve method that involves performing absorption/excitation correction and overlap correction is employed, the X-ray fluorescence spectrometer being configured to irradiate a sample with primary X-rays and obtain a content of a component in the sample by the quantification unit on the basis of measured intensities of fluorescent X-rays generated through the irradiation, wherein
An X-ray fluorescence spectrometer comprising a quantification unit in which a fundamental parameter method that includes overlap correction is employed, the X-ray fluorescence spectrometer being configured to irradiate a sample with primary X-rays and obtain a content of a component in the sample by the quantification unit on the basis of measured intensities of fluorescent X-rays generated through the irradiation, wherein
Dependencies are inferred from the claim text.