G01N 23/2208
All measurements being of a secondary emission
Official title: all measurements being of a secondary emission, e.g. combination of SE measurement and characteristic X-ray measurement
G01N23/2208 (All measurements being of a secondary emission) appears on 51 US grants and 55 published applications in this corpus.
Search patents in G01N- Granted patents
- 51
- Published applications
- 55
- Assignees
- 42
- Inventors
- 129
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 1 |
| 2010 | 0 | 1 |
| 2011 | 0 | 1 |
| 2012 | 1 | 1 |
| 2013 | 0 | 2 |
| 2014 | 2 | 1 |
| 2015 | 3 | 5 |
| 2016 | 2 | 2 |
| 2017 | 4 | 2 |
| 2018 | 4 | 2 |
| 2019 | 0 | 3 |
| 2020 | 3 | 4 |
| 2021 | 6 | 7 |
| 2022 | 1 | 2 |
| 2023 | 6 | 12 |
| 2024 | 6 | 6 |
| 2025 | 6 | 3 |
| 2026 | 5 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
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- Method and system for non-destructive metrology of thin layers13 Feb 2025US 2025/0052704 A1Nova Measuring Instruments Ltd.
- Patterned x-ray emitting target2 Jan 2025US 2025/0006451 A1Nova Measuring Instruments Ltd.
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Most cited
By later US patents
- Apparatus for solid surface analysis using X-ray spectroscopy11US 5,369,275 AFujikura Ltd. · 1994
- Systems, devices, and methods for x-ray fluorescence analysis of geological samples5US 11,592,407 B2Enersoft Inc. · 2023
- Variable rate scanning in an electron microscope5US 8,207,499 B2Applied Materials Israel Ltd. · 2012
- Method and system for non-destructive metrology of thin layers3US 10,533,961 B2Nova Measuring Instruments Ltd. · 2020
- Electron microscope3US 5,142,149 AHitachi, Ltd. · 1992