G01N 23/20016
Goniometers
G01N23/20016 (Goniometers) appears on 92 US grants and 89 published applications in this corpus.
Search patents in G01N- Granted patents
- 92
- Published applications
- 89
- Assignees
- 37
- Inventors
- 172
- Latest grant
- 18 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1987 | 1 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 2 | 0 |
| 2001 | 0 | 0 |
| 2002 | 2 | 0 |
| 2003 | 1 | 2 |
| 2004 | 2 | 3 |
| 2005 | 5 | 3 |
| 2006 | 0 | 3 |
| 2007 | 5 | 1 |
| 2008 | 0 | 0 |
| 2009 | 0 | 1 |
| 2010 | 3 | 2 |
| 2011 | 0 | 1 |
| 2012 | 2 | 1 |
| 2013 | 1 | 1 |
| 2014 | 2 | 0 |
| 2015 | 1 | 9 |
| 2016 | 4 | 1 |
| 2017 | 3 | 7 |
| 2018 | 7 | 3 |
| 2019 | 3 | 12 |
| 2020 | 7 | 2 |
| 2021 | 9 | 7 |
| 2022 | 4 | 12 |
| 2023 | 9 | 7 |
| 2024 | 7 | 4 |
| 2025 | 6 | 6 |
| 2026 | 2 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- X-ray detector for X-ray diffraction analysis apparatus18 Aug 2026US 12,710,383 B2Malvern Panalytical Limited
- Correction apparatus, system, method, and program30 Jun 2026US 12,669,450 B2Rigaku Corporation
- Transmission X-ray diffraction apparatus and related method7 Oct 2025US 12,436,115 B2Proto Patents Ltd.
- Device for rotating a specimen about two orthogonal axes5 Aug 2025US 12,379,335 B2Helmholtz-Zentrum Berlin FüR Materialien Und Energie GmbH
- X-ray diffraction apparatus and measurement method27 May 2025US 12,313,573 B2Rigaku Corporation
- Device for Contactless Measurement of the Microstructure of Moving Material Webs1 Oct 2026US 2026/0298848 A1IMS Messsysteme GmbH
- Open-air, variable-temperature x-ray diffractometer11 Dec 2025US 2025/0377319 A1King Fahd University of Petroleum and Minerals
- X-ray diffraction apparatus and measurement method4 Sep 2025US 2025/0277764 A1Rigaku Corporation
- Method, x-ray diffraction system, and program for calculating miscut angle of single-crystal solid sample28 Aug 2025US 2025/0271368 A1Rigaku Corporation
- Recording apparatus, system, method, and program26 Jun 2025US 2025/0208071 A1Rigaku Corporation
Most cited
By later US patents
- X-ray diffractometer with adjustable image distance36US 6,069,934 AOsmic, Inc. · 2000
- X-ray thin film inspection apparatus and thin film inspection apparatus and method for patterned wafer34US 7,258,485 B2Rigaku Corporation · 2007
- X-ray analysis apparatus including a parabolic X-ray mirror and a crystal monochromator32US 6,359,964 B1U. S. Philips Corporation · 2002
- Apparatus and method for X-ray analysis with hybrid control of beam divergence20US 10,782,252 B2Malvern Panalytical Limited · 2020
- X-ray diffraction screening system convertible between reflection and transmission modes18US 7,242,745 B22007