X-ray detector for X-ray diffraction analysis apparatus

Abstract

An X-ray detector for an X-ray diffraction analysis apparatus comprises a sensor, a readout circuit, a processor and a display output for communicating a display signal to a display device. The sensor detects X-ray photons by converting an X-ray photon incident on the sensor into a sensor output signal. The readout circuit receives the sensor output signal from the sensor and determines an X-ray photon count, by counting the sensor output signal. The processor is configured to calculate an X-ray intensity value using the X-ray photon count, and to generate a display signal for displaying an image representing the X-ray intensity value. The display output is configured to communicate the display signal to a display device for displaying the X-ray intensity value.

Dependencies are inferred from the claim text.