X-ray diffractometer with adjustable image distance
AssigneeOsmic, Inc.
InventorsBoris Verman, Licai Jiang
Life of this patent
Estimating the term…
Abstract
An x-ray diffractometer system comprising an x-ray optic which directs x-rays, a sample placed into said directed x-rays, wherein said sample diffracts said directed x-rays, creating a diffraction pattern, a translation stage coupled to said sample for moving said sample within said directed x-rays, whereby the resolution, angular range, and intensity of said diffraction pattern may be adjusted, and an x-ray detector for registering said diffraction pattern.
Claims32
An x-ray diffractometer system comprising:
- a reflector optic which directs x-rays;
- and
- a sample holding means, wherein a sample is placed into said sample holding means and said directed x-rays, wherein said sample diffracts said directed x-rays, creating a diffraction pattern, and wherein said sample is movable in a coaxial fashion within said directed x-rays by a translation means, whereby the resolution, angular range, and intensity of said diffraction pattern are capable of being adjusted.
An x-ray diffractometer system comprising:
- a focusing x-ray optic which focuses x-rays;
- a sample holding means for placing a sample into said focused x-rays, wherein a portion of said focused x-rays travels through said sample, said sample diffracting said focused x-rays, creating a diffraction pattern;
- and
- a translation stage coupled to said sample for moving said sample coaxially within said focused x-rays, whereby the resolution, angular range, and intensity of said diffraction pattern are capable of being adjusted.
A method of generating and registering an x-ray diffraction pattern of a sample comprising:
- generating x-rays;
- directing said x-rays at a sample;
- translating said sample coaxially through said x-rays;
- creating a diffraction pattern from said sample;
- and
- detecting said diffraction pattern.
Dependencies are inferred from the claim text.