G01N 23/18
Investigating the presence of flaws defects or foreign matter
G01N23/18 (Investigating the presence of flaws defects or foreign matter) appears on 471 US grants and 536 published applications in this corpus.
Search patents in G01N- Granted patents
- 471
- Published applications
- 536
- Assignees
- 340
- Inventors
- 1,234
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 10 | 0 |
| 1977 | 3 | 0 |
| 1978 | 1 | 0 |
| 1979 | 1 | 0 |
| 1980 | 2 | 0 |
| 1981 | 2 | 0 |
| 1982 | 2 | 0 |
| 1983 | 4 | 0 |
| 1984 | 5 | 0 |
| 1985 | 1 | 0 |
| 1986 | 4 | 0 |
| 1987 | 7 | 0 |
| 1988 | 4 | 0 |
| 1989 | 10 | 0 |
| 1990 | 8 | 0 |
| 1991 | 4 | 0 |
| 1992 | 7 | 0 |
| 1993 | 5 | 0 |
| 1994 | 2 | 0 |
| 1995 | 5 | 0 |
| 1996 | 0 | 0 |
| 1997 | 6 | 0 |
| 1998 | 4 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 3 | 0 |
| 2002 | 1 | 1 |
| 2003 | 1 | 1 |
| 2004 | 1 | 3 |
| 2005 | 4 | 3 |
| 2006 | 2 | 1 |
| 2007 | 2 | 1 |
| 2008 | 1 | 1 |
| 2009 | 0 | 1 |
| 2010 | 3 | 4 |
| 2011 | 0 | 3 |
| 2012 | 2 | 6 |
| 2013 | 2 | 7 |
| 2014 | 7 | 6 |
| 2015 | 2 | 8 |
| 2016 | 8 | 15 |
| 2017 | 8 | 18 |
| 2018 | 14 | 32 |
| 2019 | 24 | 39 |
| 2020 | 33 | 42 |
| 2021 | 38 | 41 |
| 2022 | 32 | 63 |
| 2023 | 53 | 65 |
| 2024 | 56 | 52 |
| 2025 | 48 | 72 |
| 2026 | 29 | 51 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Dust hood hold down22 Sep 2026US 12,741,328 B2Eagle Machinery & Supply, Inc.
- Fast 3D radiography with multiple pulsed X-ray sources by deflecting tube electron beam using electro-magnetic field1 Sep 2026US 12,721,585 B2AIXScan Inc.
- Target X-ray inspection system and method1 Sep 2026US 12,723,994 B2Viken Detection Corporation
- X-ray measuring method and X-ray measuring device for measuring a strand1 Sep 2026US 12,723,995 B2CiTEX Holding GmbH
- Stack cell for easy confirmation of separator folding, separator inspection device and inspection method1 Sep 2026US 12,725,841 B2LG Energy Solution, Ltd.
- X-ray transmission inspection apparatus and x-ray transmission inspection method8 Oct 2026US 2026/0309652 A1Hitachi High-Tech Science Corporation
- Method for measuring defects in two-component compound wafer and apparatus thereof8 Oct 2026US 2026/0309655 A1SK Siltron Co., Ltd.
- Semiconductor inspection apparatus and inspection method24 Sep 2026US 2026/0287525 A1Kabushiki Kaisha Toshiba
- Material Detection in X-Ray Security Screening24 Sep 2026US 2026/0290018 A1Rapiscan Holdings, Inc.
- X-ray inspection apparatus17 Sep 2026US 2026/0276565 A1Ishida Co., Ltd.
Most cited
By later US patents
- X-ray inspection system249US 4,803,639 AGeneral Electric Company · 1989
- Inspection system for cross-sectional imaging201US 5,592,562 AInternational Business Machines Corporation · 1997
- Multiple image scanning X-ray method and apparatus193US 5,237,598 A1993
- Inspection system for cross-sectional imaging165US 5,719,952 AInternational Business Machines Corporation · 1998
- Method and apparatus for improved inspection and classification of attributes of a workpiece101US 6,272,437 B1CAE Inc. · 2001