Material Detection in X-Ray Security Screening

A method for processing X-ray image data in an X-ray security screening system, the method comprising:

• receiving a material detection mode indicative of a material of interest;
• selecting, based on the material detection mode, a threshold effective atomic number (Zeff-threshold) representative of the material of interest;
• obtaining X-ray image data of an object, wherein the X-ray image data comprises a plurality of pixels each having an associated attenuation value and effective atomic number (Zeff) value;
• processing the X-ray image data using the selected Zeff-threshold to generate processed image data indicative of a maximum potential presence of the material of interest;
• and
• maintaining the selected Zeff-threshold as a persistent parameter associated with the processed image data for use in at least one subsequent processing or display stage.

An X-ray security screening system, comprising:

• an X-ray scanning device configured to obtain X-ray image data of an object, the X-ray image data comprising a plurality of pixels each having an attenuation value and an effective atomic number (Zeff) value;
• at least one processor configured to:
• receive at least one of a plurality of material detection modes indicative of a material of interest;
• select, based on the received at least one of the plurality of material detection modes, a threshold effective atomic number (Zeff-threshold) representative of the material of interest;
• process the X-ray image data using the selected Zeff-threshold to generate processed image data indicative of a maximum potential presence of the material of interest;
• and
• associate the selected Zeff-threshold with the processed image data such that the Zeff-threshold persists across multiple processing or display stages.

A non-transient computer readable medium storing programmatic instructions that, when executed by at least one processor, processes X-ray image data by:

• receiving a material detection mode indicative of a material of interest;
• selecting, based on the material detection mode, a threshold effective atomic number (Zeff-threshold) representative of the material of interest;
• obtaining X-ray image data of an object, wherein the X-ray image data comprises a plurality of pixels each having an associated attenuation value and effective atomic number (Zeff) value;
• processing the X-ray image data using the selected Zeff-threshold to generate processed image data indicative of a maximum potential presence of the material of interest;
• maintaining the selected Zeff-threshold as a persistent parameter associated with the processed image data for use in at least one subsequent processing or display stage;
• and
• storing the Zeff-threshold as metadata associated with the processed image data.