G01N 2223/323
Irradiation range monitor
Official title: irradiation range monitor, e.g. light beam
G01N2223/323 (Irradiation range monitor) appears on 16 US grants and 18 published applications in this corpus.
Search patents in G01N- Granted patents
- 16
- Published applications
- 18
- Assignees
- 22
- Inventors
- 67
- Latest grant
- 16 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 1 |
| 2015 | 0 | 2 |
| 2016 | 0 | 2 |
| 2017 | 2 | 2 |
| 2018 | 1 | 1 |
| 2019 | 3 | 1 |
| 2020 | 1 | 0 |
| 2021 | 1 | 0 |
| 2022 | 0 | 3 |
| 2023 | 1 | 1 |
| 2024 | 2 | 2 |
| 2025 | 2 | 2 |
| 2026 | 1 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method for automatically setting up computed tomography scan parameters16 Jun 2026US 12,656,275 B2Lumafield, Inc.
- Transmission X-ray diffraction apparatus and related method7 Oct 2025US 12,436,115 B2Proto Patents Ltd.
- Method for quantitatively characterizing dendrite segregation and dendrite spacing of high-temperature alloy ingot10 Jun 2025US 12,326,434 B2NCS Testing Technology CO., LTD
- X-ray imaging device5 Mar 2024US 11,921,057 B2Anseen Inc.
- Positioning of x-ray imaging system using an optical camera23 Jan 2024US 11,879,854 B2Baker Hughes Oilfield Operations LLC
- Evaluation Method and Analyzer Apparatus1 Jan 2026US 2026/0002895 A1JEOL Ltd.
- Analysis of Low-energy X-ray Fluorescence Emitted from Sample in Atmospheric Environment20 Nov 2025US 2025/0354943 A1Bruker Technologies Ltd.
- Electron beam mask inspection apparatus2 Oct 2025US 2025/0305972 A1NuFlare Technology, Inc.
- Method and apparatus for using radiation imaging data to analyze components7 Nov 2024US 2024/0369500 A1Rtx Corporation
- Method for automatically setting up computed tomography scan parameters7 Mar 2024US 2024/0077434 A1Lumafield, Inc.
Most cited
By later US patents
- Apparatus for charged particle spectroscopy11US 4,255,656 AKratos LLC · 1981
- Handling misalignment in differential phase contrast imaging8US 9,903,827 B2Koninklijke Philips N. V. · 2018
- X-ray irradiation apparatus provided with irradiation range monitor6US 4,969,177 AHoriba, Ltd. · 1990
- X-ray fluorescence analyzer and measurement position adjusting method therefore3US 9,791,392 B2Hitachi High-Tech Science Corporation · 2017
- X-ray diffraction measurement method and apparatus2US 10,591,425 B2Honda Motor Co., Ltd. · 2020