Analysis of Low-energy X-ray Fluorescence Emitted from Sample in Atmospheric Environment
AssigneeBruker Technologies Ltd.
InventorsAsher Peled, Alexander Krokhmal, Matthew Wormington
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AssigneeBruker Technologies Ltd.
InventorsAsher Peled, Alexander Krokhmal, Matthew Wormington
Estimating the term…
A system for X-ray analysis, the system includes: (a) an X-ray analysis assembly, which is (i) disposed in an X-ray enclosure configured to maintain a controlled first pressure, and (ii) configured to direct a first X-ray beam toward a sample positioned out of the X-ray enclosure at a second pressure different from the first pressure, and to produce a signal indicative of a second X-ray beam emitted from the sample in response to the first X-ray beam impinging on the sample, and (b) a window assembly, which is disposed between the X-ray analysis assembly and the sample and is configured to (i) seal the X-ray enclosure to maintain a pressure difference between the first and second pressures, and (ii) pass the first and second X-ray beams, and the window assembly includes a window layer made from a material transparent to the first and second X-ray beams.
A system for X-ray analysis, the system comprising:
A method for producing an X-ray analysis system, the method comprising:
Dependencies are inferred from the claim text.