G01N 2223/303
Calibrating, standardising
Official title: calibrating, standardising
G01N2223/303 (Calibrating, standardising) appears on 241 US grants and 297 published applications in this corpus.
Search patents in G01N- Granted patents
- 241
- Published applications
- 297
- Assignees
- 192
- Inventors
- 749
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 1 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 2 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 2 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 1 |
| 2004 | 0 | 0 |
| 2005 | 0 | 1 |
| 2006 | 1 | 0 |
| 2007 | 0 | 3 |
| 2008 | 1 | 1 |
| 2009 | 2 | 6 |
| 2010 | 2 | 4 |
| 2011 | 5 | 3 |
| 2012 | 2 | 4 |
| 2013 | 5 | 0 |
| 2014 | 4 | 11 |
| 2015 | 5 | 14 |
| 2016 | 7 | 14 |
| 2017 | 16 | 28 |
| 2018 | 11 | 13 |
| 2019 | 24 | 25 |
| 2020 | 27 | 18 |
| 2021 | 18 | 16 |
| 2022 | 19 | 21 |
| 2023 | 20 | 23 |
| 2024 | 18 | 32 |
| 2025 | 24 | 30 |
| 2026 | 20 | 29 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Systems and methods for using multi-dimensional X-ray imaging in meat production and processing applications6 Oct 2026US 12,754,148 B2Rapiscan Holdings, Inc.
- Wafer measurement apparatus and operating method thereof15 Sep 2026US 12,736,488 B2Samsung Electronics Co., Ltd.
- X-ray measuring method and X-ray measuring device for measuring a strand1 Sep 2026US 12,723,995 B2CiTEX Holding GmbH
- X-ray inspection apparatus25 Aug 2026US 12,716,853 B2Ishida Co., Ltd.
- Device for analyzing a fluid in a sample and related method28 Jul 2026US 12,693,244 B2Totalenergies Onetech
- Stereo Augmented Radiography1 Oct 2026US 2026/0298844 A1
- Reliable non-destructive determination of sample parameter values24 Sep 2026US 2026/0287529 A1SPECS Surface Nano Analysis GmbH
- System and method for calibration of inspection tools17 Sep 2026US 2026/0276570 A1ASML Netherlands B. V.
- Calibration method and apparatus for imaging device and imaging device3 Sep 2026US 2026/0259153 A1Nuctech Company Limited
- Sample measurement device3 Sep 2026US 2026/0259155 A1Hitachi High-Tech Corporation
Most cited
By later US patents
- Radiographic system, radiographic method and computer readable medium48US 8,451,975 B2FUJIFILM Corporation · 2013
- Calibration method and device therefor25US 11,885,752 B2Rapiscan Holdings, Inc. · 2024
- X-ray fluorescence apparatus for contamination monitoring23US 10,634,628 B2Bruker Technologies Ltd. · 2020
- Measurement system and method for the noninvasive determination of properties of an object to be examined and contrast medium X-ray phase-contrast measurement22US 7,653,177 B2Siemens Aktiengesellschaft · 2010
- X-ray detection optics for small-angle X-ray scatterometry21US 10,976,270 B2Bruker Technologies Ltd. · 2021