Measurement system and method for the noninvasive determination of properties of an object to be examined and contrast medium X-ray phase-contrast measurement
AssigneeSiemens Aktiengesellschaft
InventorsJoachim Baumann, Christian David, Martin Engelhardt, Jörg Freudenberger, Eckhard Hempel, Martin Hoheisel, Matthias Honal, Thomas Mertelmeier, Franz Pfeiffer, Stefan Popescu, Manfred Schuster
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