G01N 2223/3037
Standards
Official title: standards (constitution)
G01N2223/3037 (Standards) appears on 49 US grants and 56 published applications in this corpus.
Search patents in G01N- Granted patents
- 49
- Published applications
- 56
- Assignees
- 53
- Inventors
- 148
- Latest grant
- 19 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 1 |
| 2008 | 0 | 1 |
| 2009 | 1 | 2 |
| 2010 | 1 | 3 |
| 2011 | 1 | 1 |
| 2012 | 2 | 2 |
| 2013 | 3 | 0 |
| 2014 | 2 | 5 |
| 2015 | 2 | 2 |
| 2016 | 2 | 3 |
| 2017 | 4 | 5 |
| 2018 | 2 | 1 |
| 2019 | 2 | 1 |
| 2020 | 2 | 4 |
| 2021 | 3 | 1 |
| 2022 | 4 | 4 |
| 2023 | 4 | 8 |
| 2024 | 4 | 5 |
| 2025 | 6 | 2 |
| 2026 | 2 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Apparatus for fully automated X-ray tomography system performance validation according to standards for metrology and image quality testing19 May 2026US 12,631,571 B2Baker Hughes Holdings LLC
- Method for classifying unknown particles on a surface of a semi-conductor wafer7 Apr 2026US 12,596,062 B2Siltronic AG
- Method for manufacturing reference piece for x-ray measurement of residual stress and reference piece for x-ray measurement of residual stress25 Nov 2025US 12,480,894 B2Sintokogio, Ltd.
- System and method for determining mass fractions in a test sample with wave-length dispersive x-ray fluorescence spectrometers9 Sep 2025US 12,411,098 B2Bruker AXS GmbH
- Method for quantitatively characterizing dendrite segregation and dendrite spacing of high-temperature alloy ingot10 Jun 2025US 12,326,434 B2NCS Testing Technology CO., LTD
- Reliable non-destructive determination of sample parameter values24 Sep 2026US 2026/0287529 A1SPECS Surface Nano Analysis GmbH
- Apparatus for fully automated x-ray tomography system performance validation according to standards for metrology and image quality testing9 Jul 2026US 2026/0194475 A1
- Imaging support apparatus, imaging support method, imaging support program, and radiographic imaging apparatus2 Jul 2026US 2026/0185950 A1FUJIFILM Corporation
- X-ray device calibration30 Apr 2026US 2026/0118287 A1DENTSPLY SIRONA Inc.
- X-ray fluorescence spectrometer23 Apr 2026US 2026/0110649 A1Rigaku Corporation
Most cited
By later US patents
- Bulk material analyzer calibration block10US 4,694,165 AGamma-Metrics · 1987
- Penetrameter and method of use10US 5,210,783 ALockheed Corporation · 1993
- Processes to create discrete corrosion defects on substrates and establish corrosion NDI test standards5US 8,532,952 B2Concurrent Technologies Corporation · 2013
- Spectral detector calibration5US 8,585,286 B2Koninklijke Philips N. V. · 2013
- Apparatus and method for analyzing chemical state of battery material4US 11,378,530 B2Shimadzu Corporation · 2022