Apparatus and method for analyzing chemical state of battery material

A chemical state analysis method comprising:

• irradiating an irradiation region of a predetermined surface in a sample containing a battery material with excitation rays for generating characteristic X-rays of the battery material;
• spectrally dispersing the characteristic X-rays generated in the irradiation region by being irradiated with the excitation rays by making the characteristic X-rays incident on an analyzing crystal of a flat plate provided so as to face the irradiation region through a slit parallel to the irradiation region and a predetermined crystal plane of the analyzing crystal, the slit being provided between the irradiation region and the analyzing crystal;
• detecting the characteristic X-rays spectrally dispersed by the analyzing crystal with an X-ray linear sensor provided so that linear detecting elements having a length in a direction parallel to the slit are arranged in a direction perpendicular to the slit;
• and
• generating a wavelength spectrum based on intensity of the characteristic X-rays detected by the X-ray linear sensor, obtaining a peak wavelength which is a wavelength of a peak existing in the wavelength spectrum, and obtaining a value for specifying a chemical state of the battery material in the sample based on the combination of:
• the peak wavelength;
• and a standard curve in which a value representing a chemical state and the peak wavelength are correlated with each other.

A chemical state analysis apparatus comprising:

• an excitation source configured to irradiate excitation rays to generate characteristic X-rays in a sample containing a metal material;
• an analyzing crystal formed when the characteristic X-rays are released;
• a slit arranged between the sample and the analyzing crystal;
• an X-ray sensor which receives the characteristic X-ray which was dispersed when crystals were formed;
• a wavelength spectrum generation unit configured to generate a wavelength spectrum based on intensity of the characteristic X-rays detected by the X-ray linear sensor;
• a peak wavelength determination unit configured to determine a peak wavelength which is a wavelength of a peak existing in the wavelength spectrum;
• and
• a chemical state specification unit configured to obtain a value for specifying a chemical state of the metal material in the sample based on the combination of:
• the peak wavelength determined by the peak wavelength determination unit;
• and
• a standard curve in which a value representing the chemical state and the peak wavelength are correlated with each other.

A chemical state analysis method comprising:

• an excitation source configured to irradiate excitation rays to generate characteristic X-rays in a sample containing a metal material;
• spectrally dispersing the generated characteristic X-rays through a slit provided between the irradiation region and an analyzing crystal;
• detecting the characteristic X-rays spectrally dispersed by the analyzing crystal with an X-ray sensor;
• and
• generating a wavelength spectrum based on intensity of the characteristic X-rays detected by the X-ray sensor, obtaining a peak wavelength which is a wavelength of a peak existing in the wavelength spectrum, and obtaining a value for specifying a chemical state based on the combination of the peak wavelength and a standard curve in which a value representing a chemical state of the metal material in a sample and the peak wavelength are correlated with each other.