Penetrameter and method of use
AssigneeLockheed Corporation
InventorHarry L. Wallace
Life of this patent
Estimating the term…
Abstract
A penetrameter is provided for use in evaluating the resolution of an x-ray inspection system as well a method for calibrating the resolution of the x-ray inspection system. The penetrameter comprises a radiolucent substrate, and at least one filament at the radiolucent substrate, the at least one filament being broken by a gap having a predetermined size. The method of determining the resolution of an x-ray inspection system comprises steps of: generating a radiographic image of the penetrameter, determining if the broken filament is visible, and if the broken filament is visible, determining if the gap is visible.
Claims12
A penetrameter comprising:
- a radiolucent substrate;
- and
- at least one filament at the radiolucent substrate;
- wherein the at least one filament is broken by a gap having a predetermined size.
A method of determining the resolution of an x-ray inspection system comprising the steps of:
- generating a radiographic image of a penetrameter including a plurality of filaments having different diameters, at least one of the filaments being a broken filament broken by a gap of predetermined size;
- determining if the broken filament is visible;
- and
- if the broken filament is visible, determining if the gap is visible.
Dependencies are inferred from the claim text.