G01N 21/95684
Patterns showing highly reflecting parts
Official title: {Patterns showing highly reflecting parts, e.g. metallic elements}
G01N21/95684 (Patterns showing highly reflecting parts) appears on 463 US grants and 441 published applications in this corpus.
Search patents in G01N- Granted patents
- 463
- Published applications
- 441
- Assignees
- 273
- Inventors
- 1,124
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 6 | 0 |
| 1988 | 2 | 0 |
| 1989 | 4 | 0 |
| 1990 | 3 | 0 |
| 1991 | 8 | 0 |
| 1992 | 7 | 0 |
| 1993 | 5 | 0 |
| 1994 | 4 | 0 |
| 1995 | 4 | 0 |
| 1996 | 4 | 0 |
| 1997 | 5 | 0 |
| 1998 | 7 | 0 |
| 1999 | 6 | 0 |
| 2000 | 10 | 0 |
| 2001 | 18 | 4 |
| 2002 | 12 | 20 |
| 2003 | 21 | 27 |
| 2004 | 19 | 28 |
| 2005 | 21 | 24 |
| 2006 | 21 | 18 |
| 2007 | 14 | 19 |
| 2008 | 14 | 16 |
| 2009 | 18 | 12 |
| 2010 | 12 | 19 |
| 2011 | 9 | 13 |
| 2012 | 16 | 12 |
| 2013 | 11 | 9 |
| 2014 | 6 | 18 |
| 2015 | 10 | 11 |
| 2016 | 5 | 10 |
| 2017 | 9 | 6 |
| 2018 | 11 | 18 |
| 2019 | 14 | 23 |
| 2020 | 22 | 19 |
| 2021 | 21 | 27 |
| 2022 | 17 | 21 |
| 2023 | 18 | 16 |
| 2024 | 21 | 17 |
| 2025 | 13 | 16 |
| 2026 | 13 | 18 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Nano and microscale patterned surfaces for centering a droplet29 Sep 2026US 12,748,057 B2Thermo Electron Scientific Instruments LLC
- Method for quality control of a welding joint between a pair of ends of conducting elements of an inductive winding of a stator8 Sep 2026US 12,728,486 B2ATOP S.p.A.
- Optical inspection system of eliminating image noise1 Sep 2026US 12,723,988 B2Gudeng Equipment Co., Ltd.
- Surface inspection system28 Jul 2026US 12,693,241 B2Onto Innovation Inc.
- Board testing apparatus and board testing method16 Jun 2026US 12,656,271 B2Ckd Corporation
- Camera-based sheet monitoring system8 Oct 2026US 2026/0309640 A1Honeywell International Inc.
- Method and apparatus for imaging electrochemical cell electrodes24 Sep 2026US 2026/0290916 A1Illumion Ltd
- Inspection Method, Inspection Device, and Substrate Processing Device17 Sep 2026US 2026/0276559 A1Tokyo Electron Limited
- Laser vision sensing device10 Sep 2026US 2026/0266741 A1JLT Co.,LTD.
- Method and system for characterizing a non-metallic inclusion population3 Sep 2026US 2026/0259148 A1Aktiebolaget Skf
Most cited
By later US patents
- Systems and methods for providing illumination in machine vision systems300US 6,624,597 B2Color Kinetics Incorporated · 2003
- Method and apparatus for optical inspection of substrates183US 4,877,326 AKLA Instruments Corporation · 1989
- Apparatus and method for inspection of high component density printed circuit board156US 5,455,870 ARaytheon Company · 1995
- Method for producing thin film multilayer substrate, and method and apparatus for detecting circuit conductor pattern of the substrate139US 5,278,012 AHitachi, Ltd. · 1994
- Soldering inspection system and method therefor136US 4,677,473 AMatsushita Electric Works, Ltd. · 1987