G01N 21/21
Polarisation-affecting properties
Official title: Polarisation-affecting properties (G01N21/19 takes precedence)
G01N21/21 (Polarisation-affecting properties) appears on 2,740 US grants and 2,531 published applications in this corpus.
Search patents in G01N- Granted patents
- 2,740
- Published applications
- 2,531
- Assignees
- 1,248
- Inventors
- 5,238
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 9 | 0 |
| 1977 | 6 | 0 |
| 1978 | 6 | 0 |
| 1979 | 4 | 0 |
| 1980 | 3 | 0 |
| 1981 | 5 | 0 |
| 1982 | 7 | 0 |
| 1983 | 3 | 0 |
| 1984 | 9 | 0 |
| 1985 | 9 | 0 |
| 1986 | 8 | 0 |
| 1987 | 29 | 0 |
| 1988 | 18 | 0 |
| 1989 | 20 | 0 |
| 1990 | 22 | 0 |
| 1991 | 23 | 0 |
| 1992 | 18 | 0 |
| 1993 | 13 | 0 |
| 1994 | 23 | 0 |
| 1995 | 24 | 0 |
| 1996 | 31 | 0 |
| 1997 | 24 | 0 |
| 1998 | 28 | 0 |
| 1999 | 40 | 0 |
| 2000 | 29 | 0 |
| 2001 | 36 | 19 |
| 2002 | 47 | 81 |
| 2003 | 59 | 86 |
| 2004 | 84 | 116 |
| 2005 | 83 | 129 |
| 2006 | 120 | 135 |
| 2007 | 144 | 115 |
| 2008 | 119 | 86 |
| 2009 | 106 | 114 |
| 2010 | 101 | 97 |
| 2011 | 78 | 80 |
| 2012 | 78 | 75 |
| 2013 | 83 | 101 |
| 2014 | 83 | 86 |
| 2015 | 87 | 115 |
| 2016 | 102 | 125 |
| 2017 | 102 | 96 |
| 2018 | 115 | 110 |
| 2019 | 103 | 101 |
| 2020 | 112 | 107 |
| 2021 | 95 | 118 |
| 2022 | 79 | 92 |
| 2023 | 82 | 116 |
| 2024 | 79 | 83 |
| 2025 | 106 | 78 |
| 2026 | 46 | 70 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01N 21/211Ellipsometry1,128
- G01N 21/23Bi-refringence317
- G01N 2021/216Using circular polarised lightIndexing code92
- G01N 2021/218Measuring properties of electrooptical or magnetooptical mediaIndexing code44
- G01N 2021/217Measuring depolarisation or comparing polarised and depolarised parts of lightIndexing code43
Recent patents
- Optical systems and optical measuring apparatus29 Sep 2026US 12,748,038 B2Yokogawa Electric Corporation
- Optical measurement apparatus and optical measurement method29 Sep 2026US 12,748,039 B2Samsung Electronics Co., Ltd.
- Method and system for optical characterization of patterned samples22 Sep 2026US 12,742,724 B2Nova Ltd.
- Air quality measuring device22 Sep 2026US 12,742,727 B2Samsung Electronics Co., Ltd.
- Imaging system and imaging inspection apparatus including the same22 Sep 2026US 12,742,737 B2Postech Research and Business Development Foundation
- Dark field defect inspection system and inspection method thereof8 Oct 2026US 2026/0309637 A1Samsung Electronics Co., Ltd.
- Systems and methods for determining concentrations using absorbance change with temperature1 Oct 2026US 2026/0298805 A1
- Nature-derived and nature-inspired structural color for quantitative assessment of material microstructure1 Oct 2026US 2026/0298806 A1The Regents of the University of California
- Multiple Azimuth, Multiple Pass Optical Measurements Of Semiconductor Structures1 Oct 2026US 2026/0298807 A1
- Functional layer inspection method and functional layer inspection device10 Sep 2026US 2026/0266712 A1Samsung Display Co., Ltd.
Most cited
By later US patents
- Optical spectroscopy pathlength measurement system1,175US 6,640,116 B2Masimo Corporation · 2003
- Optical spectroscopy pathlength measurement system850US 7,149,561 B2Masimo Corporation · 2006
- Optical spectroscopy pathlength measurement system741US 7,801,581 B2Masimo Laboratories, Inc. · 2010
- Focused beam spectroscopic ellipsometry method and system534US 5,608,526 ATencor Instruments · 1997
- Optical sensor device431US 5,844,682 AOMRON Corporation · 1998