G01N 2021/217
Measuring depolarisation or comparing polarised and depolarised parts of light
Official title: {Measuring depolarisation or comparing polarised and depolarised parts of light}
G01N2021/217 (Measuring depolarisation or comparing polarised and depolarised parts of light) appears on 43 US grants and 50 published applications in this corpus.
Search patents in G01N- Granted patents
- 43
- Published applications
- 50
- Assignees
- 43
- Inventors
- 100
- Latest grant
- 4 Nov 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 1 |
| 2004 | 0 | 2 |
| 2005 | 2 | 2 |
| 2006 | 3 | 0 |
| 2007 | 1 | 3 |
| 2008 | 2 | 2 |
| 2009 | 2 | 1 |
| 2010 | 2 | 0 |
| 2011 | 1 | 1 |
| 2012 | 1 | 1 |
| 2013 | 1 | 1 |
| 2014 | 0 | 2 |
| 2015 | 1 | 4 |
| 2016 | 0 | 1 |
| 2017 | 6 | 4 |
| 2018 | 1 | 5 |
| 2019 | 5 | 2 |
| 2020 | 2 | 3 |
| 2021 | 3 | 4 |
| 2022 | 1 | 3 |
| 2023 | 0 | 4 |
| 2024 | 3 | 1 |
| 2025 | 5 | 2 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Devices and methods for determining polarization characteristics from partial polarimetry4 Nov 2025US 12,460,973 B2Arizona Board of Regents on Behalf of the University of Arizona
- Polarimetric characterization of transparent objects30 Sep 2025US 12,429,416 B2Tata Consultancy Services Limited
- Method for determining a material property of an object17 Jun 2025US 12,332,045 B2M-Xr Limited
- Device and method for characterising the roughness profile of a tissue sample1 Apr 2025US 12,264,911 B2Universidad Carlos III De Madrid
- Method and system for spectral imaging of density, anisotropy, and orientation28 Jan 2025US 12,209,951 B2CZ Biohub SF, LLC
- Multi-Channel Workpiece Inspection System1 Jan 2026US 2026/0002874 A1Wolfspeed, Inc.
- Method for measuring semiconductor device11 Dec 2025US 2025/0377311 A1Samsung Electronics Co., Ltd.
- Methods for determining suitability of silicon substrates for epitaxy9 Jan 2025US 2025/0011968 A1GlobalWafers Co., Ltd.
- Devices and methods for determining polarization characteristics from partial polarimetry18 Jul 2024US 2024/0240986 A1Arizona Board of Regents on Behalf of the University of Arizona
- A method to produce a matched pair of polarizing filters and a method and apparatus to determine the concentration of birefringent particles using a pair of polarizing filters19 Oct 2023US 2023/0332995 A1His Majesty the King In Right of Canada, AS Represented By the Minister of National Defence
Most cited
By later US patents
- Concentration measuring instrument, concentration measuring contact apparatus, concentration measuring calculating apparatus, and concentration measuring method116US 7,110,112 B2Matsushita Electric Industrial Co., Ltd. · 2006
- System, method and applications involving identification of biological circuits such as neurological characteristics87US 8,401,609 B2The Board of Trustees of the Leland Stanford Junior University · 2013
- Apparatus for use in luminescence applications40US 9,851,302 B2STMicroelectronics (Research & Development) Limited · 2017
- Method and apparatus for non-invasive glucose sensing through the eye39US 6,885,882 B22005
- System for scatterometric measurements and applications39US 7,099,005 B1KLA-Tencor Technologies Corporation · 2006