G01N 2021/8864
Mapping zones of defects
Official title: {Mapping zones of defects}
G01N2021/8864 (Mapping zones of defects) appears on 167 US grants and 194 published applications in this corpus.
Search patents in G01N- Granted patents
- 167
- Published applications
- 194
- Assignees
- 112
- Inventors
- 460
- Latest grant
- 8 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 2 | 0 |
| 1996 | 1 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 1 |
| 2002 | 1 | 6 |
| 2003 | 2 | 0 |
| 2004 | 1 | 3 |
| 2005 | 1 | 0 |
| 2006 | 2 | 8 |
| 2007 | 2 | 4 |
| 2008 | 4 | 9 |
| 2009 | 6 | 3 |
| 2010 | 7 | 11 |
| 2011 | 5 | 3 |
| 2012 | 5 | 5 |
| 2013 | 4 | 8 |
| 2014 | 5 | 3 |
| 2015 | 5 | 5 |
| 2016 | 6 | 3 |
| 2017 | 9 | 11 |
| 2018 | 4 | 5 |
| 2019 | 6 | 8 |
| 2020 | 10 | 14 |
| 2021 | 7 | 20 |
| 2022 | 11 | 13 |
| 2023 | 13 | 9 |
| 2024 | 12 | 19 |
| 2025 | 16 | 9 |
| 2026 | 13 | 14 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Debris determination method8 Sep 2026US 12,731,247 B2Shin-Etsu Handotai Co., Ltd.
- Method for fault analysis in wafers18 Aug 2026US 12,710,377 B2Robert Bosch GmbH
- Detection system and method, computer device, and computer readable storage medium14 Jul 2026US 12,680,997 B2Reemoon Technology Co., Ltd.
- Method for detecting optical defects within windshield7 Jul 2026US 12,674,766 B2Saint-Gobain Sekurit France
- Non-contact electroluminescence defect detection method7 Jul 2026US 12,676,577 B2
- Inspection apparatus and determination model generation method10 Sep 2026US 2026/0266737 A1Astemo, Ltd.
- Defect inspection device, processing device, and defect inspection method30 Jul 2026US 2026/0219201 A1Hitachi High-Tech Corporation
- Evaluation method and evaluation apparatus23 Jul 2026US 2026/0210824 A1Daikin Industries, Ltd.
- Defect detection method, defect detection device, and defect detection program23 Jul 2026US 2026/0210873 A1FUJIFILM Corporation
- Defect mapping and repair systems and methods23 Jul 2026US 2026/0212487 A13M Innovative Properties Company
Most cited
By later US patents
- Two-phase optical inspection method and apparatus for defect detection177US 5,699,447 AOrbot Instruments Ltd. · 1997
- Substrate inspection method and apparatus100US 6,178,257 B1APPLIED Materials.Inc. · 2001
- Optical inspection method and apparatus62US 5,982,921 AAPPLIED Materials.Inc. · 1999
- Method and apparatus for nondestructively measuring micro defects in materials43US 5,032,734 AVti, L.L.C. · 1991
- Detecting surface flaws using computer vision40US 10,346,969 B1Amazon Technologies, Inc. · 2019