Evaluation method and evaluation apparatus
AssigneeDaikin Industries, Ltd.
InventorsNozomi HORIKAWA, Nozomi YAMAGUCHI, Kanako FUKUMOTO, Hiroto TSUKADA
Life of this patent
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Abstract
An evaluation method for evaluating one or more chalk marks on a surface of a substrate which is an evaluation target. The substrate is a textile treated with a repellent. The evaluation method includes; acquiring an image of the surface of the substrate which is the evaluation target; extracting, from the image, each of a first range with the one or more chalk marks and a second range with no chalk mark; computing a difference between a luminance value of the first range and a luminance value of the second range; and obtaining an evaluation result based on the difference.
Claims9
An evaluation method for evaluating one or more chalk marks on a surface of a substrate which is an evaluation target, wherein the substrate is a textile treated with a repellent, comprising:
- acquiring an image of the surface of the substrate which is the evaluation target;
- extracting, from the image, each of a first range with the one or more calk marks and a second range with no calk marks;
- computing a difference between a luminance value of the first range and a luminance value of the second range;
- and
- obtaining an evaluation result based on the difference.
An evaluation apparatus, for evaluating one or more chalk marks on a surface of a substrate which is an evaluation target, the evaluation apparatus acquiring an image of the surface of the substrate, wherein the evaluation apparatus includes a computing circuit, wherein the substrate is a textile with a repellent,
- wherein the computing circuit:
- extracts, from the image, each of a first range with the one or more chalk marks and a second range with no chalk mark;
- computes a difference between a luminance value of the first range and a luminance value of the second range;
- and
- outputs an evaluation result based on the difference.
Dependencies are inferred from the claim text.