G01K 7/01
Measuring temperature based on the use of electric or magnetic elements directly
Official title: using semiconducting elements having PN junctions (G01K7/02, G01K7/16, G01K7/30 take precedence)
G01K7/01 (Measuring temperature based on the use of electric or magnetic elements directly) appears on 1,351 US grants and 1,346 published applications in this corpus.
Search patents in G01K- Granted patents
- 1,351
- Published applications
- 1,346
- Assignees
- 564
- Inventors
- 2,689
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 5 | 0 |
| 1977 | 8 | 0 |
| 1978 | 7 | 0 |
| 1979 | 8 | 0 |
| 1980 | 7 | 0 |
| 1981 | 8 | 0 |
| 1982 | 1 | 0 |
| 1983 | 3 | 0 |
| 1984 | 3 | 0 |
| 1985 | 3 | 0 |
| 1986 | 3 | 0 |
| 1987 | 5 | 0 |
| 1988 | 4 | 0 |
| 1989 | 4 | 0 |
| 1990 | 4 | 0 |
| 1991 | 5 | 0 |
| 1992 | 6 | 0 |
| 1993 | 5 | 0 |
| 1994 | 8 | 0 |
| 1995 | 11 | 0 |
| 1996 | 4 | 0 |
| 1997 | 7 | 0 |
| 1998 | 9 | 0 |
| 1999 | 19 | 0 |
| 2000 | 20 | 0 |
| 2001 | 17 | 3 |
| 2002 | 13 | 10 |
| 2003 | 10 | 14 |
| 2004 | 19 | 32 |
| 2005 | 32 | 39 |
| 2006 | 37 | 43 |
| 2007 | 38 | 60 |
| 2008 | 43 | 78 |
| 2009 | 53 | 56 |
| 2010 | 58 | 50 |
| 2011 | 45 | 32 |
| 2012 | 34 | 30 |
| 2013 | 36 | 32 |
| 2014 | 22 | 52 |
| 2015 | 42 | 68 |
| 2016 | 47 | 65 |
| 2017 | 69 | 50 |
| 2018 | 60 | 68 |
| 2019 | 74 | 96 |
| 2020 | 58 | 63 |
| 2021 | 62 | 72 |
| 2022 | 71 | 83 |
| 2023 | 62 | 80 |
| 2024 | 70 | 79 |
| 2025 | 60 | 59 |
| 2026 | 52 | 32 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Lateral bipolar junction transistor device and method of forming same29 Sep 2026US 12,747,993 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Temperature ramp control for integrated circuit chips29 Sep 2026US 12,747,994 B1Auradine, Inc.
- Junction temperature estimation22 Sep 2026US 12,742,687 B2ROLLS-ROYCE plc
- Digital temperature sensor, corresponding device and method22 Sep 2026US 12,742,688 B2STMicroelectronics International N. V.
- Semiconductor apparatus, temperature compensation system, and alarm system8 Sep 2026US 12,733,433 B2Sony Semiconductor Solutions Corporation
- Low temperature error thermal sensor24 Sep 2026US 2026/0287441 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Ultrahigh-resolution micro-thermometer using semiconductor tunneling junctions10 Sep 2026US 2026/0266670 A1Rutgers, The State University of New Jersey
- System and method for detecting a laser voltage probing attack on a chip10 Sep 2026US 2026/0267972 A1National University of Singapore
- Temperature sensing of regions within a superconducting integrated circuit using in-situ resonators27 Aug 2026US 2026/0255885 A1Microsoft Technology Licensing, LLC
- Temperature sensing apparatus and method having calibration mechanism13 Aug 2026US 2026/0235453 A1Realtek Semiconductor Corp.
Most cited
By later US patents
- Temperature sensor and method for operating a temperature sensor338US 6,789,939 B2Infineon Technologies AG · 2004
- Tamperproof arrangement for an integrated circuit device226US 5,406,630 AMotorola, Inc. · 1995
- Method and apparatus for sensing and transmitting a body characteristic of a host192US 7,015,826 B1Digital Angel Corporation · 2006
- Tamperproof arrangement for an integrated circuit device172US 5,389,738 AMotorola, Inc. · 1995
- Method and apparatus for calibration of a monolithic voltage reference141US 5,440,305 ACrystal Semiconductor Corporation · 1995