System and method for detecting a laser voltage probing attack on a chip
AssigneeNational University of Singapore
InventorsHui Zhang, Qiang Fang, Udara Samurdhi Harshanga Kalingage, Longyang Lin, Massimo Alioto
Life of this patent
Estimating the term…
Abstract
A system for detecting a laser voltage probing (LVP) attack on a chip is described in an embodiment. The system comprising temperature sensors provided at predetermined intervals on the chip. Each of the temperature sensors comprises at least one transistor in an off-state. The at least one transistor of each temperature sensor is adapted to provide an increase in a leakage current in response to a rise in temperature caused by the LVP attack for detecting the LVP attack on the chip. A method for detecting a laser voltage probing attack on a chip is also described in an embodiment.
Claims18
A system for detecting a laser voltage probing (LVP) attack on a chip, the system comprising:
- temperature sensors provided at predetermined intervals on the chip, each of the temperature sensors comprising at least one transistor in an off-state,
- wherein the at least one transistor of each temperature sensor is adapted to provide an increase in a leakage current in response to a rise in temperature caused by the LVP attack for detecting the LVP attack on the chip.
A method for detecting a laser voltage probing (LVP) attack on a chip, the method comprising:
- providing temperature sensors at predetermined intervals on the chip, each of the temperature sensors comprising at least one transistor in an off-state,
- wherein the at least one transistor of each temperature sensor is adapted to provide an increase in a leakage current in response to a rise in temperature caused by the LVP attack for detecting the LVP attack on the chip.
Dependencies are inferred from the claim text.