G01B 11/065
Using one or more discrete wavelengths
Official title: {using one or more discrete wavelengths}
G01B11/065 (Using one or more discrete wavelengths) appears on 95 US grants and 45 published applications in this corpus.
Search patents in G01B- Granted patents
- 95
- Published applications
- 45
- Assignees
- 62
- Inventors
- 185
- Latest grant
- 1 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 1 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 3 | 0 |
| 1988 | 0 | 0 |
| 1989 | 4 | 0 |
| 1990 | 4 | 0 |
| 1991 | 1 | 0 |
| 1992 | 1 | 0 |
| 1993 | 3 | 0 |
| 1994 | 4 | 0 |
| 1995 | 5 | 0 |
| 1996 | 1 | 0 |
| 1997 | 2 | 0 |
| 1998 | 3 | 0 |
| 1999 | 3 | 0 |
| 2000 | 2 | 0 |
| 2001 | 5 | 0 |
| 2002 | 3 | 5 |
| 2003 | 6 | 2 |
| 2004 | 3 | 6 |
| 2005 | 4 | 2 |
| 2006 | 4 | 2 |
| 2007 | 3 | 1 |
| 2008 | 4 | 1 |
| 2009 | 2 | 1 |
| 2010 | 1 | 1 |
| 2011 | 0 | 2 |
| 2012 | 1 | 1 |
| 2013 | 2 | 1 |
| 2014 | 1 | 1 |
| 2015 | 0 | 1 |
| 2016 | 1 | 3 |
| 2017 | 2 | 1 |
| 2018 | 2 | 2 |
| 2019 | 0 | 1 |
| 2020 | 1 | 2 |
| 2021 | 2 | 0 |
| 2022 | 0 | 4 |
| 2023 | 1 | 2 |
| 2024 | 2 | 1 |
| 2025 | 5 | 1 |
| 2026 | 1 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Second harmonic generation (SHG) measurement device and measurement method using the same1 Sep 2026US 12,723,863 B2Samsung Electronics Co., Ltd.
- Device and method for measuring a substrate11 Nov 2025US 12,467,850 B2EV Group E. Thallner GmbH
- Optical measurement apparatus, measuring method using the same, and method of fabricating semiconductor device using the same1 Jul 2025US 12,345,521 B2Samsung Electronics Co., Ltd.
- Polarization imaging system and polarization imaging method3 Jun 2025US 12,320,741 B2Sony Group Corporation
- Apparatus to characterize substrates and films25 Feb 2025US 12,235,091 B2Onto Innovation Inc.
- Device and method for measuring a substrate5 Feb 2026US 2026/0036511 A1EV Group E. Thallner GmbH
- Second harmonic generation (shg) measurement device and measurement method using the same12 Jun 2025US 2025/0189295 A1Samsung Electronics Co., Ltd.
- Apparatus to characterize substrates and films25 Jan 2024US 2024/0027186 A1Onto Innovation Inc.
- Polarization imaging system and polarization imaging method2 Feb 2023US 2023/0034139 A1Sony Group Corporation
- Optical measurement apparatus, measuring method using the same, and method of fabricating semiconductor device using the same5 Jan 2023US 2023/0000343 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Method and apparatus for evaluating the thickness of thin films189US 5,181,080 ATherma-Wave, Inc. · 1993
- Method for film thickness and refractive index determination141US 4,909,631 A1990
- Method and apparatus for measuring properties of thin materials using polarized light117US 4,672,196 A1987
- Device for measuring the thickness of thin films113US 5,517,312 ANova Measuring Instruments Ltd. · 1996
- Rotating-compensator ellipsometer96US 4,053,232 AInternational Business Machines Corporation · 1977