Y10S 977/87
Optical lever arm for reflecting light
Y10S977/87 (Optical lever arm for reflecting light) appears on 97 US grants and 14 published applications in this corpus.
Search patents in Y10S- Granted patents
- 97
- Published applications
- 14
- Assignees
- 46
- Inventors
- 139
- Latest grant
- 3 Jan 2012
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1990 | 1 | 0 |
| 1991 | 1 | 0 |
| 1992 | 3 | 0 |
| 1993 | 7 | 0 |
| 1994 | 6 | 0 |
| 1995 | 9 | 0 |
| 1996 | 6 | 0 |
| 1997 | 6 | 0 |
| 1998 | 11 | 0 |
| 1999 | 13 | 0 |
| 2000 | 7 | 0 |
| 2001 | 8 | 1 |
| 2002 | 3 | 6 |
| 2003 | 5 | 3 |
| 2004 | 5 | 4 |
| 2005 | 5 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Scanning stylus atomic force microscope with cantilever tracking and optical access3 Jan 2012US 8,087,288 B1Bruker Nano, Inc.
- Scanning probe microscope with improved probe head mount4 Oct 2005US 6,951,129 B2PSIA Corporation
- Scanning probe microscope with improved probe tip mount20 Sep 2005US 6,945,100 B2PSIA Corporation
- Apparatus and method for isolating and measuring movement in a metrology apparatus16 Aug 2005US 6,928,863 B2Veeco Instruments Inc.
- Removable probe sensor assembly and scanning probe microscope28 Jun 2005US 6,910,368 B2Raymax Technology, Inc.
- Removable probe sensor assembly and scanning probe microscope16 Dec 2004US 2004/0250608 A1Raymax Technology, Inc.
- Scanning probe microscope with improved probe tip mount22 Jul 2004US 2004/0140424 A1PSIA Corporation
- Scanning probe microscope with improved probe head mount22 Jul 2004US 2004/0140426 A1PSIA Corporation
- Apparatus and method for isolating and measuring movement in a metrology apparatus15 Jul 2004US 2004/0134264 A1Veeco Instruments Inc.
- Fabry-perot resonator and system for measuring and calibrating displacement of a cantilever tip using the same in atomic force microscope11 Dec 2003US 2003/0226955 A1Korea Research Institute of Standards and Science
Most cited
By later US patents
- High resolution scanning raman microscope149US 6,002,471 ACalifornia Institute of Technology · 1999
- Large stage system for scanning probe microscopes and other instruments125US 5,672,816 APark Scientific Instruments · 1997
- Scanning probe microscope having scan correction90US 5,210,410 AThe Board of Trustees of the Leland Stanford Junior University · 1993
- Atomic force microscope with optional replaceable fluid cell88US 4,935,634 AThe Regents of the University of California · 1990
- Scanning probe microscope having a single viewing device for on-axis and oblique angle views87US 5,714,756 APark Scientific Instruments · 1998