Removable probe sensor assembly and scanning probe microscope

A scanning probe microscope comprising a detachable assembly and means to create relative movement between said detachable assembly and a sample where said detachable assembly comprises:

• a. a light source for creating a beam of light,
• b. a probe assembly for sensing a surface of said sample and
• c. at least one detector for detecting said beam of light after said beam of light has been at least partially reflected from said probe assembly,
• whereby said means to create movement causes said detachable assembly to move said light source, said probe assembly and said at least one detector in unison relative to said sample surface.

A removable probe illuminator assembly for use in a scanning probe microscope, said microscope comprising means for creating relative movement between said probe illuminator assembly and a sample, said probe illuminator assembly attached to said means for creating relative movement, and said probe illuminator assembly comprising:

• a. a light source for creating a beam of light,
• b. at least one optical element selected from the group consisting of lenses and mirrors,
• c. a probe assembly for sensing a surface of said sample, and
• d. at least one detector for detecting said beam of light after said beam of light has been at least partially reflected from said probe assembly,
• whereby said sample is substantially fixed relative to said microscope in a direction substantially normal to a plane representing the mean values of said sample surface.