Y10S 977/851
Particular movement or positioning of scanning tip
Y10S977/851 (Particular movement or positioning of scanning tip) appears on 215 US grants and 50 published applications in this corpus.
Search patents in Y10S- Granted patents
- 215
- Published applications
- 50
- Assignees
- 82
- Inventors
- 304
- Latest grant
- 26 Feb 2013
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1989 | 2 | 0 |
| 1990 | 3 | 0 |
| 1991 | 4 | 0 |
| 1992 | 4 | 0 |
| 1993 | 11 | 0 |
| 1994 | 15 | 0 |
| 1995 | 20 | 0 |
| 1996 | 17 | 0 |
| 1997 | 10 | 0 |
| 1998 | 25 | 0 |
| 1999 | 20 | 0 |
| 2000 | 7 | 0 |
| 2001 | 18 | 5 |
| 2002 | 5 | 6 |
| 2003 | 9 | 3 |
| 2004 | 11 | 5 |
| 2005 | 4 | 6 |
| 2006 | 4 | 9 |
| 2007 | 3 | 4 |
| 2008 | 6 | 2 |
| 2009 | 6 | 6 |
| 2010 | 2 | 1 |
| 2011 | 7 | 2 |
| 2012 | 1 | 1 |
| 2013 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Scanning probe-based lithography method26 Feb 2013US 8,387,160 B2International Business Machines Corporation
- Scanning probe microscope capable of measuring samples having overhang structure26 Jun 2012US 8,209,766 B2Park Systems Corp.
- Nanometer scale instrument for biochemically, chemically, or catalytically interacting with a sample material25 Oct 2011US 8,046,843 B2General Nanotechnology LLC
- Scanning probe apparatus11 Oct 2011US 8,035,089 B2Canon Kabushiki Kaisha
- Method for direct fabrication of nanostructures16 Aug 2011US 7,998,528 B2Massachusetts Institute of Technology
- Nanometer Scale Instrument for Biochemically, Chemically, or Catalytically Interacting with a Sample Material14 Jun 2012US 2012/0147722 A1General Nanotechnology LLC
- Apparatus for Direct Fabrication of Nanostructures8 Dec 2011US 2011/0297084 A1Massachusetts Institute of Technology
- Scanning probe-based lithography method27 Jan 2011US 2011/0020533 A1International Business Machines Corporation
- Scanning probe microscope capable of measuring samples having overhang structure1 Jul 2010US 2010/0170015 A1Park Systems Corp.
- Nanometer Scale Instrument for Biochemically, Chemically, or Catalytically Interacting with a Sample Material31 Dec 2009US 2009/0324450 A1General Nanotechnology LLC
Most cited
By later US patents
- Scanning probe microscope143US 5,376,790 APark Scientific Instruments · 1994
- Tapping atomic force microscope140US 5,412,980 ADigital Instruments, Inc. · 1995
- Jumping probe microscope123US 5,266,801 ADigital Instruments, Inc. · 1993
- Tapping atomic force microscope with phase or frequency detection109US 5,519,212 ADigital Instruments, Inc. · 1996
- Atomic force microscope for high speed imaging including integral actuator and sensor99US 5,883,705 AThe Board of Trustees of the Leland Stanford Jr. University · 1999