Topometrix
Santa Clara, CA, US· latest recorded location
Topometrix is named on 13 US grants and 0 published applications in this corpus. Its most frequent classification is G01Q (Scanning-probe techniques or apparatus).
- Granted patents
- 13
- Published applications
- 0
- Inventors
- 5
- Granted in 2026 so far
- 0
- Most recent grant
- 28 Oct 1997
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1993 | 1 | 0 |
| 1994 | 2 | 0 |
| 1995 | 4 | 0 |
| 1996 | 3 | 0 |
| 1997 | 3 | 0 |
By publication year.
Technology areas
Share of 13 documents
- G01QScanning-probe techniques or apparatus12
- Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests12
- B82YSpecific uses or applications of nanostructures8
- H01JElectric discharge tubes or discharge lamps2
- G01NInvestigating or analysing materials by determining their chemical or physical properties1
- H02NElectric machines not otherwise provided for1
Recent patents
- Resonance contact scanning force microscope28 Oct 1997US 5,681,987 A
- Scanning apparatus linearization and calibration system24 Jun 1997US 5,641,897 A
- Resonance contact scanning force microscope29 Apr 1997US 5,625,142 A
- Scanning probe microscope apparatus for use in a scanning electron microscope23 Apr 1996US 5,510,615 A
- Synchronous sampling scanning force microscope16 Apr 1996US 5,507,179 A
No published applications.
Most cited
By later US patents
- Thermal sensing scanning probe microscope and method for measurement of thermal parameters of a specimen142US 5,441,343 A1995
- Scanning probe microscope apparatus for use in a scanning electron76US 5,455,420 A1995
- Scanning probe microscope apparatus for use in a scanning electron microscope74US 5,510,615 A1996
- Synchronous sampling scanning force microscope53US 5,406,832 A1995
- Scanning force microscope with integrated optics and cantilever mount48US 5,291,775 A1994