H01J 49/488
With retarding grids
Official title: {with retarding grids}
H01J49/488 (With retarding grids) appears on 31 US grants and 18 published applications in this corpus.
Search patents in H01J- Granted patents
- 31
- Published applications
- 18
- Assignees
- 21
- Inventors
- 63
- Latest grant
- 5 Nov 2024
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 2 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 3 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 4 | 0 |
| 1989 | 2 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 1 | 0 |
| 1997 | 2 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 1 |
| 2003 | 1 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 1 |
| 2006 | 1 | 1 |
| 2007 | 0 | 0 |
| 2008 | 1 | 1 |
| 2009 | 1 | 0 |
| 2010 | 0 | 2 |
| 2011 | 0 | 0 |
| 2012 | 0 | 3 |
| 2013 | 2 | 0 |
| 2014 | 2 | 1 |
| 2015 | 2 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 2 |
| 2019 | 1 | 0 |
| 2020 | 1 | 0 |
| 2021 | 0 | 0 |
| 2022 | 0 | 2 |
| 2023 | 0 | 0 |
| 2024 | 2 | 0 |
| 2025 | 0 | 2 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Apparatus for ion energy analysis of plasma processes5 Nov 2024US 12,136,542 B2Impedans Ltd
- Apparatus for ion energy analysis of plasma processes20 Feb 2024US 11,908,668 B2Impedans Ltd
- Electrostatic lens, and parallel beam generation device and parallel beam convergence device which use electrostatic lens and collimator7 Apr 2020US 10,614,992 B2National University Corporation Nara Institute of Science and Technology
- Retarding potential type energy analyzer11 Jun 2019US 10,319,578 B2Japan Synchrotron Radiation Research Institute
- Methods of electrical signaling in an ion energy analyzer21 Jul 2015US 9,087,677 B2Tokyo Electron Limited
- Retarding field energy analyzer with magnetic filter12 Mar 2026US 2026/0074174 A1APPLIED Materials.Inc.
- Residual gas analyser, projection exposure apparatus comprising a residual gas analyser and method of residual gas analysis29 May 2025US 2025/0174452 A1Carl Zeiss SMT GmbH
- Apparatus for ion energy analysis of plasma processes13 Feb 2025US 2025/0054740 A1
- Apparatus for ion energy analysis of plasma processes19 May 2022US 2022/0157581 A1Impedans Ltd
- Apparatus for ion energy analysis of plasma processes10 Mar 2022US 2022/0076933 A1Impedans Ltd
Most cited
By later US patents
- Apparatus and method for contact-free potential measurements of an electronic composition34US 4,277,679 ASiemens Aktiengesellschaft · 1981
- Low-abberation spectrometer objective with high secondary electron acceptance20US 4,728,790 ASiemens Aktiengesellschaft · 1988
- Device for contact-free potential measurements17US 4,292,519 ASiemens Aktiengesellschaft · 1981
- Spectrometer objective having parallel objective fields and spectrometer fields for the potential measuring technique17US 4,540,885 ASiemens Aktiengesellschaft · 1985
- Spectrometer lens for particle beam apparatus17US 4,769,543 ASiemens Aktiengesellschaft · 1988