Spectrometer objective having parallel objective fields and spectrometer fields for the potential measuring technique
AssigneeSiemens Aktiengesellschaft
InventorsErich Plies, Reinhard Weyl, Burkhard Lischke
Life of this patent
Estimating the term…
Abstract
An apparatus for the potential measuring technique has an objective lens for focusing primary electrons onto an object, and also has a spectrometer for the energy selection of secondary electrons to provide an improvement of the quantitative potential measurement on printed conductors of integrated microelectronic components with improved local resolution, higher probe current, and improved potential resolution. The objective lens is a magnetic lens in which the lens field lies largely outside the lens body, and the spectrometer is an electrostatic retarding field spectrometer arranged in the magnetic field of the lens.
Claims11
A potential measuring technique apparatus, comprising:
- an objective lens means for focusing primary electrons on an object;
- spectrometer secondary electron detection means for energy selection of secondary electrons;
- said objective lens means comprising a magnetic lens in which a magnetic field thereof lies primarily outside a body of the lens means;
- the spectrometer detection means comprising an electrostatic retarding field spectrometer detection means arranged in the magnetic field of the lens means;
- and
- the magnetic lens and spectrometer detection means being designed such that the magnetic field and an electric field of the spectrometer detection means run substantially in a same direction and with field lines parallel to one another.
A potential measuring technique apparatus, comprising:
- objective lens means for focusing primary electrons on an object;
- spectrometer secondary electron detection means for energy selection of secondary electrons;
- said objective lens means comprising a magnetic lens in which a magnetic field thereof lies primarily outside a body of the lens means;
- and
- the spectrometer detection means comprising an electrostatic retarding field field spectrometer detection means arranged in the magnetic field of the lens means such that the magnetic field and an electric field of the spectrometer detection means are substantially parallel with one another so that the electric field is substantially spatially superimposed on the magnetic lens field.
A potential measuring technique apparatus, comprising:
- an objective lens means for focusing primary electrons on an object;
- spectrometer secondary electron detection means for energy selection of secondary electrons;
- said objective lens means comprising a magnetic lens in which a magnetic field thereof lies primarily outside a body of the lens means;
- the spectrometer detection means comprising an electrostatic retarding field spectrometer detection means arranged in the magnetic field of the lens means;
- and
- the magnetic lens and spectrometer detection means being designed such that the magnetic field and an electric field of the spectrometer detection means run substantially in an opposite direction and with field lines parallel to one another.
Dependencies are inferred from the claim text.