H01J 2237/2588
Lorenz microscopy
Official title: Lorenz microscopy (magnetic field measurement)
H01J2237/2588 (Lorenz microscopy) appears on 6 US grants and 5 published applications in this corpus.
Search patents in H01J- Granted patents
- 6
- Published applications
- 5
- Assignees
- 7
- Inventors
- 16
- Latest grant
- 18 Oct 2022
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| Year | Granted patents | Published applications |
|---|---|---|
| 2003 | 1 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 1 |
| 2006 | 0 | 0 |
| 2007 | 1 | 0 |
| 2008 | 0 | 1 |
| 2009 | 0 | 1 |
| 2010 | 1 | 1 |
| 2011 | 1 | 0 |
| 2012 | 1 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 0 | 1 |
| 2021 | 0 | 0 |
| 2022 | 1 | 0 |
By publication year.
Recent patents
- Magnetic material observation method, and magnetic material observation apparatus18 Oct 2022US 11,474,169 B2National Institutes for Quantum Science and Technology
- Magnetic domain imaging system17 Apr 2012US 8,158,940 B2JEOL Ltd.
- Electron beam device12 Apr 2011US 7,923,685 B2Hitachi, Ltd.
- Transmission electron microscope13 Jul 2010US 7,755,046 B2Hitachi, Ltd.
- Electron microscope equipped with magnetic microprobe10 Jul 2007US 7,241,995 B2JEOL Ltd.
- Magnetic material observation method, and magnetic material observation apparatus6 Aug 2020US 2020/0249288 A1National Institutes for Quantum and Radiological Science and Technology
- Magnetic Domain Imaging System25 Nov 2010US 2010/0294932 A1JEOL Ltd.
- Electron beam device20 Aug 2009US 2009/0206256 A1Hitachi, Ltd.
- Transmission electron microscope4 Sep 2008US 2008/0210868 A1Hitachi, Ltd.
- Electron microscope equipped with magnetic microprobe15 Dec 2005US 2005/0274889 A1JEOL Ltd.
Most cited
By later US patents
- Transmission electron microscope4US 7,755,046 B2Hitachi, Ltd. · 2010
- Electron beam device4US 7,923,685 B2Hitachi, Ltd. · 2011
- Technique to quantitatively measure magnetic properties of thin structures at <10 NM spatial resolution3US 6,590,209 B1The Regents of the University of California · 2003
- Magnetic material observation method, and magnetic material observation apparatus2US 11,474,169 B2National Institutes for Quantum Science and Technology · 2022