Electron beam device
AssigneeHitachi, Ltd.
InventorsKen Harada, Hiroto Kasai
Life of this patent
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Abstract
A multi-biprism electron interferometer is configured so as to arrange a plurality of biprisms in an imaging optical system of a specimen. An upper electron biprism is arranged upstream of the specimen in the traveling direction of the electron beam, and an image of the electron biprism is formed on the specimen (object plane) using an imaging action of a pre-field of the objective lens. A double-biprism interference optical system is constructed of a lower electron biprism disposed downstream of the objective lens up to the first image plane of the specimen.
Claims8
An electron beam device comprising,
- an electron beam source,
- a condenser optical system for irradiating an electron beam emitted from the source onto a specimen,
- a specimen holder for holding the specimen irradiated with the electron beam, and
- an imaging lens system for imaging the specimen,
- wherein a first electron biprism is disposed downstream of the condenser optical system in a traveling direction of the electron beam on an optical axis of the electron beam device and upstream of a position at which the specimen is disposed in the traveling direction of the electron beam and a second electron biprism is disposed downstream of the first electron biprism in the traveling direction of the electron beam via the specimen and one or a plurality of lenses of the imaging lens system,
- wherein the device comprises an electron optical system in which in a first electromagnetic lens located downstream of the first electron biprism in the traveling direction of the electron beam, an image of the first electron biprism is formed in a magnetic field of the first electromagnetic lens by one or a plurality of times, an image thereof is also formed on an object plane of second electromagnetic lenses and thereafter downstream of the first electromagnetic lens in the traveling direction of the electron beam, and the image forming actions are obtained in subsequent downstream lens systems, and
- wherein a position of the specimen along an axis of the electron beam is identical to one image plane or one of plural image planes on each of which the image of the first electron biprism is formed.
An electron beam device comprising,
- an electron beam source,
- a condenser optical system for irradiating an electron beam emitted from the source onto a specimen,
- a specimen holder for holding the specimen irradiated with the electron beam and an imaging lens system for imaging the specimen,
- wherein the specimen is disposed downstream of the condenser optical system in a traveling direction of the electron beam on an optical axis of the electron beam device and upstream of the imaging lens system in the traveling direction of the electron beam, a first electron biprism is disposed in a magnetic field of a first electromagnetic lens belonging to the imaging lens system in the traveling direction of the electron beam and a second electron biprism is disposed downstream of the first electron biprism in the traveling direction of the electron beam.
Dependencies are inferred from the claim text.