H01J 2237/2443
Scintillation detectors
H01J2237/2443 (Scintillation detectors) appears on 198 US grants and 167 published applications in this corpus.
Search patents in H01J- Granted patents
- 198
- Published applications
- 167
- Assignees
- 90
- Inventors
- 437
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 3 | 0 |
| 1980 | 1 | 0 |
| 1981 | 1 | 0 |
| 1982 | 1 | 0 |
| 1983 | 1 | 0 |
| 1984 | 2 | 0 |
| 1985 | 2 | 0 |
| 1986 | 2 | 0 |
| 1987 | 4 | 0 |
| 1988 | 1 | 0 |
| 1989 | 5 | 0 |
| 1990 | 1 | 0 |
| 1991 | 4 | 0 |
| 1992 | 2 | 0 |
| 1993 | 3 | 0 |
| 1994 | 1 | 0 |
| 1995 | 2 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 3 | 1 |
| 2002 | 1 | 1 |
| 2003 | 4 | 4 |
| 2004 | 2 | 1 |
| 2005 | 1 | 1 |
| 2006 | 0 | 4 |
| 2007 | 2 | 6 |
| 2008 | 5 | 6 |
| 2009 | 6 | 8 |
| 2010 | 6 | 4 |
| 2011 | 10 | 6 |
| 2012 | 6 | 8 |
| 2013 | 5 | 7 |
| 2014 | 9 | 8 |
| 2015 | 9 | 8 |
| 2016 | 7 | 5 |
| 2017 | 5 | 9 |
| 2018 | 4 | 5 |
| 2019 | 10 | 8 |
| 2020 | 6 | 12 |
| 2021 | 12 | 9 |
| 2022 | 8 | 13 |
| 2023 | 14 | 13 |
| 2024 | 5 | 10 |
| 2025 | 10 | 5 |
| 2026 | 8 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Charged particle beam device and specimen observation method15 Sep 2026US 12,738,442 B2Hitachi High-Tech Corporation
- Fiber optics plate, scintillator panel, radiation detector, electron microscope, X-ray blocking method and electron beam blocking method18 Aug 2026US 12,709,569 B2Hamamatsu Photonics K.K.
- Charged-particle optical device18 Aug 2026US 12,712,147 B2ASML Netherlands B. V.
- Particle beam system21 Apr 2026US 12,609,272 B2Carl Zeiss Microscopy GmbH
- Detector and method for obtaining Kikuchi images14 Apr 2026US 12,603,246 B2Bruker Nano, Inc.
- Scanning electron microscope and photomultiplier therefor and method of evaluating a sample27 Aug 2026US 2026/0253835 A1Applied Materials Israel Ltd.
- Particle beam system13 Aug 2026US 2026/0237594 A1Carl Zeiss Microscopy GmbH
- Mobile radiation detector system for ion implanters28 May 2026US 2026/0148928 A1Axcelis Technologies, Inc.
- Electron beam microscope12 Mar 2026US 2026/0074142 A1
- Method and apparatus for in-situ sample quality inspection in cryogenic focused ion beam milling26 Feb 2026US 2026/0056014 A1Technische Universiteit Delft
Most cited
By later US patents
- Apparatus and method for obtaining topographical dark-field images in a scanning electron microscope45US 7,714,287 B1KLA-Tencor Corporation · 2010
- Detector objective for particle beam apparatus43US 4,831,266 ASiemens Aktiengesellschaft · 1989
- Multi-beam particle microscope and method for operating same40US 9,536,702 B2Carl Zeiss Microscopy GmbH · 2017
- Method of detecting electrons, an electron-detector and an inspection system36US 9,336,982 B2Carl Zeiss Microscopy GmbH · 2016
- Integrated circuit structure analysis33US 5,191,213 AOlivetti Systems & Networks S.r.l. · 1993