H01J 2237/2008
Specially adapted for studying electrical or magnetical properties of objects
Official title: specially adapted for studying electrical or magnetical properties of objects
H01J2237/2008 (Specially adapted for studying electrical or magnetical properties of objects) appears on 85 US grants and 98 published applications in this corpus.
Search patents in H01J- Granted patents
- 85
- Published applications
- 98
- Assignees
- 48
- Inventors
- 210
- Latest grant
- 14 Apr 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 4 |
| 2006 | 0 | 3 |
| 2007 | 2 | 3 |
| 2008 | 3 | 7 |
| 2009 | 5 | 2 |
| 2010 | 4 | 5 |
| 2011 | 1 | 9 |
| 2012 | 7 | 2 |
| 2013 | 6 | 5 |
| 2014 | 9 | 6 |
| 2015 | 6 | 11 |
| 2016 | 4 | 3 |
| 2017 | 3 | 5 |
| 2018 | 8 | 3 |
| 2019 | 2 | 3 |
| 2020 | 6 | 3 |
| 2021 | 1 | 4 |
| 2022 | 7 | 3 |
| 2023 | 1 | 10 |
| 2024 | 2 | 3 |
| 2025 | 6 | 4 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Lithium-ion supply electrode for real-time microscopic analysis and method of manufacturing same14 Apr 2026US 12,603,294 B2Postech Research and Business Development Foundation
- Measurement system and probe tip landing method18 Nov 2025US 12,474,371 B2Windbond Electronics Corp.
- Method for testing a packaging substrate, and apparatus for testing a packaging substrate28 Oct 2025US 12,455,313 B2APPLIED Materials.Inc.
- Metal pattern inspection method and focused ion beam apparatus28 Oct 2025US 12,456,599 B2V Technology Co., Ltd.
- Charged particle beam device and sample observation method2 Sep 2025US 12,406,824 B2Hitachi High-Tech Corporation
- Method and apparatus for preparing samples for imaging20 Nov 2025US 2025/0357076 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Device for holding a sample, system and manufacturing method13 Nov 2025US 2025/0349499 A1Forschungszentrum Julich GmbH
- Airless transfer and electrical testing of solid state batteries in scanning electron microscopes2 Oct 2025US 2025/0308837 A1FEI Company
- Method for testing a packaging substrate, and apparatus for testing a packaging substrate7 Aug 2025US 2025/0251446 A1APPLIED Materials.Inc.
- Measurement system and probe tip landing method22 Aug 2024US 2024/0280605 A1Winbond Electronics Corp.
Most cited
By later US patents
- Charged particle beam system110US 8,304,725 B2Hitachi High-Technologies Corporation · 2012
- Charged particle beam device probe operation57US 7,319,336 B2Zyvex Instruments, LLC · 2008
- Transmission electron microscope (TEM) power probe for in-situ viewing of electromigration and operation of an integrated circuit or microprocessor35US 5,124,645 AThe United States of America as represented by the Secretary of the Air Force · 1992
- Inspection device27US 8,497,476 B2Ebara Corporation · 2013
- Specimen holder used for mounting20US 8,513,621 B2Protochips, Inc. · 2013