G06F 11/2231

To test interrupt circuits

Official title: {to test interrupt circuits}

G06F11/2231 (To test interrupt circuits) appears on 18 US grants and 8 published applications in this corpus.

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Granted patents
18
Published applications
8
Assignees
11
Inventors
37
Latest grant
7 Oct 2025

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G06F 11/2231: granted patents and published applications per publication year
YearGranted patentsPublished applications
199310
199410
199500
199600
199710
199810
199920
200010
200100
200210
200301
200410
200500
200600
200710
200800
200900
201000
201100
201200
201300
201400
201502
201611
201713
201840
201900
202010
202100
202200
202300
202400
202511

By publication year. Applications have been published since 2001.

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