G06F 11/2226
To test alu
Official title: {to test ALU}
G06F11/2226 (To test alu) appears on 33 US grants and 23 published applications in this corpus.
Search patents in G06F- Granted patents
- 33
- Published applications
- 23
- Assignees
- 24
- Inventors
- 84
- Latest grant
- 1 Aug 2023
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 2 | 0 |
| 1990 | 3 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 2 | 0 |
| 1997 | 1 | 0 |
| 1998 | 2 | 0 |
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 1 | 0 |
| 2003 | 0 | 1 |
| 2004 | 0 | 1 |
| 2005 | 0 | 2 |
| 2006 | 1 | 1 |
| 2007 | 0 | 2 |
| 2008 | 1 | 2 |
| 2009 | 1 | 0 |
| 2010 | 1 | 1 |
| 2011 | 1 | 1 |
| 2012 | 0 | 1 |
| 2013 | 3 | 1 |
| 2014 | 1 | 3 |
| 2015 | 0 | 1 |
| 2016 | 2 | 1 |
| 2017 | 2 | 0 |
| 2018 | 0 | 1 |
| 2019 | 2 | 0 |
| 2020 | 0 | 2 |
| 2021 | 2 | 1 |
| 2022 | 1 | 1 |
| 2023 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Method and apparatus for testing artificial intelligence chip, device and storage medium1 Aug 2023US 11,714,128 B2Kunlunxin Technology (Beijing) Company Limited
- Method of testing one or more compute units11 Oct 2022US 11,467,830 B2Arm Limited
- Residue checking of entire normalizer output of an extended result26 Oct 2021US 11,159,183 B2International Business Machines Corporation
- System and method for storing operating life history on a non-volatile dual inline memory module11 May 2021US 11,003,778 B2Dell Products L. P.
- Method of ensuring operation of calculator24 Dec 2019US 10,514,970 B2Toyota Jidosha Kabushiki Kaisha
- Method of testing one or more compute units4 Aug 2022US 2022/0244956 A1Arm Limited
- Method and apparatus for testing artificial intelligence chip, device and storage medium22 Jul 2021US 2021/0223311 A1Beijing Baidu Netcom Science Technology Co., Ltd.
- Residue checking of entire normalizer output of an extended result31 Dec 2020US 2020/0412388 A1International Business Machines Corporation
- System and Method for Storing Operating Life History on a Non-volatile Dual Inline Memory Module19 Nov 2020US 2020/0364339 A1Dell Products L. P.
- Method of ensuring operation of calculator17 May 2018US 2018/0137000 A1Toyota Jidosha Kabushiki Kaisha
Most cited
By later US patents
- Data processor including testing structure for a barrel shifter22US 4,962,500 ANEC Corporation · 1990
- Non-scan design-for-testability of RT-level data paths22US 5,513,123 ANEC USA, Inc. · 1996
- Method of operating enhanced alu test hardware13US 4,618,956 ATandem Computers Incorporated · 1986
- Built in shelf test method and apparatus for booth multipliers12US 5,960,009 ALucent Technologies Inc. · 1999
- System for generating floating point test vectors11US 5,572,664 AAdvanced Micro Devices, Inc. · 1996