G05B 2219/31466
Display position of different workpieces, tools in system
G05B2219/31466 (Display position of different workpieces, tools in system) appears on 18 US grants and 22 published applications in this corpus.
Search patents in G05B- Granted patents
- 18
- Published applications
- 22
- Assignees
- 15
- Inventors
- 39
- Latest grant
- 15 Aug 2023
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|---|---|---|
| 2003 | 0 | 1 |
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| 2005 | 0 | 2 |
| 2006 | 0 | 1 |
| 2007 | 2 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 2 |
| 2011 | 0 | 0 |
| 2012 | 1 | 0 |
| 2013 | 1 | 3 |
| 2014 | 2 | 1 |
| 2015 | 0 | 1 |
| 2016 | 1 | 3 |
| 2017 | 0 | 1 |
| 2018 | 1 | 1 |
| 2019 | 4 | 1 |
| 2020 | 0 | 0 |
| 2021 | 2 | 1 |
| 2022 | 2 | 3 |
| 2023 | 2 | 0 |
| 2024 | 0 | 1 |
By publication year.
Recent patents
- Method for detecting environmental parameter in semiconductor fabrication facility15 Aug 2023US 11,726,465 B2Taiwan Semiconductor Manufacturing Company.Ltd
- NC program conversion process method and processing treatment system24 Jan 2023US 11,561,527 B2Hitachi, Ltd.
- Method for detecting environmental parameter in semiconductor fabrication facility8 Nov 2022US 11,493,909 B1Taiwan Semiconductor Manufacturing Company.Ltd
- NC program conversion process method and processing treatment system24 May 2022US 11,340,581 B2Hitachi, Ltd.
- 3D visualizations of in-process products based on machine tool input12 Oct 2021US 11,144,041 B2The Boeing Company
- Display apparatus and display method4 Jan 2024US 2024/0004364 A1Seiko Epson Corporation
- Method for detecting environmental parameter in semiconductor fabrication facility24 Nov 2022US 2022/0375801 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Method for detecting environmental parameter in semiconductor fabrication facility20 Oct 2022US 2022/0334570 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Nc program conversion process method and processing treatment system1 Sep 2022US 2022/0276631 A1Hitachi, Ltd.
- NC Program Conversion Process Method and Processing Treatment System7 Oct 2021US 2021/0311456 A1Hitachi, Ltd.
Most cited
By later US patents
- Semiconductor fabrication facility visualization system with performance optimization41US 8,229,587 B2Muratec Automation Co., Ltd. · 2012
- Real time monitoring system of semiconductor manufacturing information12US 7,286,897 B2Taiwan Semiconductor Manufacturing Company.Ltd · 2007
- Arrangement and method for monitoring a position of a hand-held tool10US 10,031,511 B2Robert Bosch GmbH · 2018
- Method for manufacturing an item8US 7,162,799 B2Ford Motor Company · 2007
- Substrate processing apparatus and display method for substrate processing apparatus3US 8,352,069 B2Hitachi Kokusai Electric Inc. · 2013