Semiconductor fabrication facility visualization system with performance optimization

One or more computer-readable media configured to store instructions that are executable by one or more processors to perform operations comprising:

• collecting fabrication facility data for a fabrication facility;
• identifying, in the fabrication facility data, data patterns;
• identifying, based on the data patterns, a decrease in performance of an operation of the fabrication facility at a first time relative to performance of the operation at a second time;
• implementing, in response to identification of the decrease in the performance, experiments, wherein an experiment comprises one or more modifications to conditions of the fabrication facility at the first time;
• identifying, based on comparing results of the experiments, an experiment with a result specifying an increase in the performance of the operation relative to other of the results for other of the experiments;
• and
• executing, at a third time when conditions of the fabrication facility correspond to at least one of the conditions at the first time, a command to implement at least one of one or more modifications of the experiment identified by the one or more processors.

A method implemented by one or more processors, comprising:

• collecting fabrication facility data for a fabrication facility;
• identifying, in the fabrication facility data, data patterns;
• identifying, based on the data patterns, a decrease in performance of an operation of the fabrication facility at a first time relative to performance of the operation at a second time;
• implementing, in response to identification of the decrease in the performance, experiments, wherein an experiment comprises one or more modifications to conditions of the fabrication facility at the first time;
• identifying, based on comparing results of the experiments, an experiment with a result specifying an increase in the performance of the operation relative to other of the results for other of the experiments;
• and
• executing, at a third time when conditions of the fabrication facility correspond to at least one of the conditions at the first time, a command to implement at least one of one or more modifications of the experiment identified by the one or more processors.