G01R 33/0325
Using the kerr effect
Official title: {using the Kerr effect}
G01R33/0325 (Using the kerr effect) appears on 49 US grants and 38 published applications in this corpus.
Search patents in G01R- Granted patents
- 49
- Published applications
- 38
- Assignees
- 34
- Inventors
- 118
- Latest grant
- 18 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 2 | 0 |
| 1998 | 3 | 0 |
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 1 | 0 |
| 2003 | 1 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 1 |
| 2006 | 1 | 0 |
| 2007 | 1 | 0 |
| 2008 | 0 | 1 |
| 2009 | 0 | 1 |
| 2010 | 0 | 1 |
| 2011 | 0 | 1 |
| 2012 | 4 | 1 |
| 2013 | 1 | 1 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 2 | 2 |
| 2017 | 1 | 2 |
| 2018 | 3 | 0 |
| 2019 | 2 | 2 |
| 2020 | 0 | 2 |
| 2021 | 5 | 7 |
| 2022 | 2 | 5 |
| 2023 | 5 | 3 |
| 2024 | 4 | 3 |
| 2025 | 3 | 2 |
| 2026 | 2 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- System and method for performing characterization of a sample18 Aug 2026US 12,710,490 B2Onto Innovation Inc.
- Magnetic field sensor using acoustically driven ferromagnetic resonance20 Jan 2026US 12,531,049 B2The Regents of the University of California
- Method and apparatus for measuring spin-orbit torque30 Dec 2025US 12,510,608 B2Samsung Electronics Co., Ltd.
- Inspection device7 Oct 2025US 12,439,607 B2Samsung Electronics Co., Ltd.
- Inspection device10 Jun 2025US 12,327,579 B2Samsung Electronics Co., Ltd.
- Magnetic field sensor using acoustically driven ferromagnetic resonance16 Jul 2026US 2026/0204248 A1The Regents of the University of California
- Method and apparatus for measuring spin-orbit torque26 Mar 2026US 2026/0086174 A1Samsung Electronics Co., Ltd.
- Device for measuring magnetic characteristics24 Jul 2025US 2025/0237622 A1Samsung Electronics Co., Ltd.
- System and method for performing characterization of a sample12 Jun 2025US 2025/0189605 A1Onto Innovation Inc.
- Semiconductor manufacturing device and semiconductor manufacturing method15 Aug 2024US 2024/0272245 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Method and apparatus for performing magnetic field measurements using magneto-optic kerr effect sensors32US 5,631,559 ANortheastern University · 1997
- Apparatus and method for measuring instantaneous power using a magneto-optic Kerr effect sensor29US 5,994,898 ANortheastern University · 1999
- Magneto-optic Kerr effect stress sensing system20US 5,493,220 ANortheastern University · 1996
- Method and apparatus for performing magnetic field measurements using magneto-optic Kerr effect sensors18US 5,736,856 ANortheastern University · 1998
- Magnetic multilayer device, method for producing such a device, magnetic field sensor, magnetic memory and logic gate using such a device11US 8,247,093 B2Centre National De La Recherche Scientifique · 2012