G01R 31/2803
By means of functional tests
Official title: {by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor (testing electronic digital computers G06F11/00)}
G01R31/2803 (By means of functional tests) appears on 59 US grants and 66 published applications in this corpus.
Search patents in G01R- Granted patents
- 59
- Published applications
- 66
- Assignees
- 56
- Inventors
- 195
- Latest grant
- 21 Apr 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 2 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 1 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 2 |
| 2006 | 1 | 3 |
| 2007 | 1 | 1 |
| 2008 | 1 | 2 |
| 2009 | 0 | 0 |
| 2010 | 1 | 1 |
| 2011 | 0 | 2 |
| 2012 | 1 | 3 |
| 2013 | 3 | 1 |
| 2014 | 2 | 2 |
| 2015 | 0 | 3 |
| 2016 | 1 | 3 |
| 2017 | 4 | 7 |
| 2018 | 4 | 5 |
| 2019 | 14 | 5 |
| 2020 | 3 | 2 |
| 2021 | 4 | 8 |
| 2022 | 4 | 1 |
| 2023 | 4 | 4 |
| 2024 | 3 | 2 |
| 2025 | 2 | 4 |
| 2026 | 1 | 4 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Electrical and logic isolation for systems on a chip21 Apr 2026US 12,607,666 B2Texas Instruments Incorporated
- Semiconductor test device and system and test method using the same17 Jun 2025US 12,332,298 B2Samsung Electronics Co., Ltd.
- Integrated circuit profiling and anomaly detection3 Jun 2025US 12,320,844 B2Proteantecs Ltd.
- Method, arrangement and computer program product for debugging a printed circuit board2 Jul 2024US 12,025,651 B2JTAG Technologies B.V.
- Functional test head for printed circuit boards26 Mar 2024US 11,940,480 B2Anora, LLC
- System for Testing Electronic Devices on the Move13 Aug 2026US 2026/0235660 A1
- Segmented testing method for functional safety testing circuit, electronic device, and storage medium18 Jun 2026US 2026/0169060 A1VeriSilicon Microelectronics (Shanghai) Co., Ltd.
- Test apparatus and method for testing pcba of a diagnostic device22 Jan 2026US 2026/0023106 A1Church & Dwight Co., Inc.
- Rotatable platform8 Jan 2026US 2026/0009662 A1
- Process Corner Simulation System Capable of Processing a Duty Cycle and Speed-based Process Corner Simulations21 Aug 2025US 2025/0264520 A1Realtek Semiconductor Corp.
Most cited
By later US patents
- Load calculating device and load calculating method15US 7,653,510 B2Kabushiki Kaisha Toshiba · 2010
- System and method for error location in printed wire assemblies by external power on self test (post) commands12US 5,535,330 ADell USA, L. P. · 1996
- System and related methods, apparatuses, and computer program products for testing components of an aerosol delivery device11US 9,609,895 B2RAI Strategic Holdings, Inc. · 2017
- Monitoring accesses to a region of an integrated circuit chip9US 10,866,279 B2UltraSoC Technologies Ltd. · 2020
- System for detecting motherboard operation to ensure compatibility of a microprocessor to be coupled thereto8US 5,841,287 AAdvanced Micro Devices, Inc. · 1998